Webcast to explain bead probe technology

Agilent Technologies is holding a free webcast on Medalist bead probe technology.

Agilent Technologies is holding a free webcast on Medalist bead probe technology.

The webcast will present a technology overview and discuss the benefits realised by testing PCBs populated with bead probes during in-circuit test.

Topics will include layout independence of this technology, which removes the need for time-consuming PCB layout changes; improved test access and coverage; how to maintain excellent probe contact and minimising trace rerouting.

Agilent Medalist bead probe technology is an exciting new methodology for placing test points directly onto the copper traces of a printed circuit board (PCB).

The hour-long webcast will be held at 1900 GMT on 24th January 2007.

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