Product category:
Stand-Alone Instruments
News Release from: Agilent Technologies Europe | Subject: VTEP v2.0 tests and Network Parameter Measurement
Edited by the Electronicstalk Editorial
Team on 23 February 2007
Test suite finds opens on power and
ground pins
The VTEP 2.0 suite of vectorless test techniques includes the new Network Parameter Measurement technology which allows users to detect opens on power and ground pins on connectors.
Agilent's Medalist VTEP v2.0 is a suite of vectorless test techniques that includes the new Network Parameter Measurement technology which allows users to detect opens on power and ground pins on connectors This is something that many industry players had conceded as beyond existing test capabilities
This article was originally published on Electronicstalk on 17 Jun 2008 at 8.00am (UK)
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Proper grounding is becoming increasingly crucial with higher onboard signal speeds, for example on PCIe, DDR and SATA connectors.
With increased speeds, opens on ground pins may lead to lowered signal-integrity design margins, increased bit-error rates (BER) and increased radiated electromagnetic interference (EMI).
Agilent's VTEP v2.0 is designed to help manufacturers detect these critical defects, which could escape detection right through functional test and product shipment, resulting in costly liability to manufacturers at a later stage.
Also with VTEP v2.0, users get the benefit of the original VTEP technology, which has higher sensitivities and better noise reduction, as well as iVTEP, which is intended for ultra-small integrated circuit packages with minimal or no lead frames.
iVTEP also works for devices with heat spreaders and even those with attached heat sinks.
"VTEP v2.0 brings to the table the best that vectorless testing has to offer", says NK Chari, Agilent's Marketing Manager for in-circuit test.
"With the original VTEP technology as its core and strengthened by key innovations like our award-winning iVTEP and the new Network Parameter Measurement technology, VTEP v2.0 gives users a much bigger picture on what they have been missing in terms of vectorless test coverage.
"We want manufacturers to access this valuable innovation, which we believe will offer new levels of coverage unseen before that is why we are offering VTEP v2.0 free-of-charge with all new Medalist i3070 systems", says Chari.
VTEP v2.0 uses the same hardware as the original VTEP, therefore, no hardware upgrade is required.
Agilent VTEP v2.0 is available at no additional cost on all new Agilent Medalist i3070 systems, which will begin shipping March 2007, and is also available free-of-charge to existing Agilent ICT customers on software upgrade contract.
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