Signal integrity analysis explained

Application notes concentrate on valuable information quickly obtained with simple techniques that can be used to help get designs right the first time to minimise design iterations.

Agilent Technologies is offering a free three-part series of application notes on signal integrity analysis.

These three signal integrity application notes are valuable tools for creating topology models, S parameter behavioural models, characterisation of rise time degradation, interconnect bandwidth, near- and far-end crosstalk, odd mode, even mode, differential and common impedance, mode conversion and complete differential channel characterisation.

This application note series concentrates on the valuable information quickly obtained with simple techniques that can be used to help you get designs right the first time to minimise design iterations.

Part 1 covers time domain reflectometry (TDR).

This paper discusses why TDR is not just a simple radar station for understanding impedance discontinuities of transmission lines, and how TDR can be used for more than 40 characterisation, modelling and emulation applications.

Part 2 covers four-port TDR using vector network analysers (VNAs) and Agilent's Physical Layer Test System (PLTS).

This paper shows how four-port TDR using a VNA can be used to perform more than 100 critical characterisation, modelling, and emulation applications for high-speed and digital design.

It also discusses how interconnect analysis using the PLTS software application can enable the power of the VNA with the ease-of-use of a TDR.

Part 3 covers de-embedding.

This paper goes into detail on why de-embedding is an essential error correction technique used in advanced signal integrity measurements and calibration.

Various error correction methodologies will be compared with de-embedding with the goal of minimising test fixture artefacts such as insertion loss, reflections and phase error.

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