Noise generator speeds data testing

The accurate signals of the Agilent 81150A help engineers test their device, not the signal source.

Agilent Technologies has released the industry's first pulse function arbitrary noise generator, which provides superior signal quality and versatile waveforms.

It is suitable for general purpose bench tests or advanced serial data stress tests.

Design and test engineers are under pressure to get products to market faster with reduced design schedules and higher quality goals.

The Agilent 81150A pulse function arbitrary noise generator provides versatile waveforms for pulse generation as well as noise generation for stress testing.

It is the optimum stimulus for use in conjunction with Agilent's 5/6/80000 Infiniium real-time oscilloscope or DCA-J sampling oscilloscope for serial data testing.

Its integration into one instrument minimises cabling, space and test time.

Engineers need to create suitable and worst-case signals to get insight into devices and designs such as semiconductor circuits, sensors or modulators.

The accurate signals of the Agilent 81150A help engineers test their device, not the signal source.

When signal fidelity matters, just enough signal quality is not enough.

"Versatile waveforms and the most precise signals are key contributors for developing quality products with a reduced design cycle", said Alois Hauk, Vice President and General Manager of Digital Photonic Test at Agilent.

Various stress tests can be achieved by simply adjusting the crest factor, an indicator of signal quality using peak-to-peak and root mean square voltages.

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