HF test socket takes two separate packages

Edited by the Electronicstalk editorial team May 21, 2002

Aries Electronics has developed a high-frequency test socket with a replaceable spring probe interposer.

Aries Electronics has developed a high-frequency test socket with a replaceable spring probe interposer.

The replaceable interposer enables users to accommodate two separate interposers with the same base socket, eliminating the need for two full sockets.

The new socket features easy to replace solderless single-ended spring probes, allowing the probes to be changed at the test site.

It also comes standard with four locating posts to ensure accurate mating between the socket test board and chip guides for accurate device location.

Hinged lid, double-latched lid or CAM-style lid options are also available.

The socket's extremely small footprint provides maximum use of the test board area.

Pitches for the socket are available from 0.5 to 0.8mm and signal path lengths are only 2.41mm (0.095in).

Maximum contact resistance is 60mohm after 500,000 life cycles and probe self-inductance is as low as 0.5nH.

As with all Aries test sockets, the high frequency spring probe test socket is available in custom materials, sizes, and configurations to suit specific customer applications.

Pricing for the high frequency test socket starts at $3,500 per unit.

Delivery is 2-4 weeks ARO.