Product category:
Test Accessories
News Release from: Aries Electronics | Subject: High-frequency test sockets
Edited by the Electronicstalk Editorial
Team on 23 October 2002
Novel lid tops off high-frequency test
sockets
Aries Electronics now offers its line of high-frequency test sockets with a new cam lid that helps eliminate damage to package pads.
Aries Electronics now offers its line of high-frequency test sockets with a new cam lid that helps eliminate damage to package pads By providing precise z-directional force with no x or y movement, no stress is applied against the side of the contacts and solder balls remain undamaged
This article was originally published on Electronicstalk on 5 Oct 2004 at 8.00am (UK)
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Aries Electronics has developed a high-frequency test socket with a replaceable spring probe interposer.
Additionally, the load can be applied to the device after the socket is closed and latched.
The new lid can be used on both double-latched and hinged designs in any of Aries' high frequency test sockets, including Microstrip Contact, Spring Probe and Kapton Interposer sockets.
The cam lid provides no preload on package when the lid is in the open position, making it easier to apply the load, especially in high I/O counts.
The lid's positive spring clip lock in the closed position ensures that there is no loss of z-force during test, resulting in increased accuracy.
Only a quarter turn is needed for a full 0.045in of z-directional travel providing quick actuation.
The lid's aluminium base supports cam and pressure assembly to help maintain full compression on the package during test so there is no loss of z-movement due to deflection.
All insulating material is made from Torlon 5530, a 30% glass-filled polyamide-imide (PAI) that provides greater dimensional control and improved load capacity.
Pricing for a high-frequency test socket with up to 200 leads and the new cam lid starts at $3700 per unit.
Delivery is 6 weeks ARO.
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