Product category:
Test Accessories
News Release from: Aries Electronics | Subject: High-frequency test sockets
Edited by the Electronicstalk Editorial
Team on 05 October 2004
RF socket boasts minimal signal loss
Aries Electronics has a new high-frequency test socket for devices from 28 to 55mm2 wide.
Aries Electronics has a new high-frequency test socket for devices from 28 to 55mm2 wide The new socket is ideal for manual testing of devices with pitches down to 0.50mm, in applications with speeds from 1 to more than 10GHz, such as CSP, microBGA, DSP, LGA, SRAM, DRAM and Flash devices
This article was originally published on Electronicstalk on 23 Oct 2002 at 8.00am (UK)
Related stories
Novel lid tops off high-frequency test sockets
Aries Electronics now offers its line of high-frequency test sockets with a new cam lid that helps eliminate damage to package pads.
Tool straightens pins with no static risk
Aries Electronics has introduced the first antistatic version of a tool that provides a fast, easy and inexpensive means of straightening the pins of DIP IC devices.
HF test socket takes two separate packages
Aries Electronics has developed a high-frequency test socket with a replaceable spring probe interposer.
The new RF socket provides minimal signal loss for higher bandwidth capability via a signal path of only 1.95mm.
The four-point spring probe crown on the new socket ensures "scrub" on solder ball oxides for reliable contact mating, and the pointed probe works with LGAs, MLFs and other socket types.
Single point probes are available for small land area contact pads.
The socket can be easily mounted to and removed from the test board, thanks to solderless, pressure-mount compression spring probes accurately located by two moulded plastic alignment pins and secured with four stainless steel screws.
These gold over nickel compression spring probes leave very small witness marks on the bottom of the device solder balls.
In addition, the socket's small overall size provides the maximum allowable space for load board components and connectors.
Estimated contact life is over 500,000 cycles and contact self-inductance is 0.51nH.
Contact forces of the new centre probe sockets are 9 to 12g per contact for 0.50 to 0.75mm pitches, and 17 to 20g per contact for 0.80mm pitches and larger.
Operating temperature is -55 to +150C.
The compression spring probes are heat-treated beryllium copper alloy, plated with at least 0.75um gold per MIL-G-45204 over 0.75um nickel per QQ-N-290.
The socket's moulded components are UL94V0 Peek and/or Ultem.
All hardware is stainless steel.
As with all Aries sockets, the new RF test socket is available in custom materials, platings, sizes and configurations to suit specific customer applications.
Pricing for a molded 415-lead RF centre probe socket for 2.4GHz applications starts at $1122 each for up to nine pieces.
Delivery is six weeks ARO.
• Aries Electronics: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page

