Product category:
Test Accessories
News Release from: Aries Electronics | Subject: RF test sockets
Edited by the Electronicstalk Editorial
Team on 11 July 2006
Test sockets handle complex RF devices
A new high frequency test socket for devices from 41 to 55mm2 is ideal for manual testing of devices with pitches down to 0.40mm, in applications with speeds from 1GHz to more than 18GHz.
Aries Electronics has introduced a new high frequency test socket for devices from 41 to 55mm2 The new socket is ideal for manual testing of devices with pitches down to 0.40mm, in applications with speeds from 1GHz to more than 18GHz, such as CSP, MicroBGA, DSP, LGA, SRAM, DRAM and Flash devices
This article was originally published on Electronicstalk on 9 Jan 2003 at 8.00am (UK)
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RF test sockets gain thermoelectric cooling
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Speedy delivery for test sockets
Aries Electronics now offers expedited delivery of two weeks, versus six weeks, for its standard lines of Microstrip and Spring Probe RF test sockets.
The new RF socket's overall size of 89.08 x 69.85 x 44.68mm provides the maximum allowable space for load board components and connectors.
In addition, the four-point spring probe crown on the socket ensures "scrub" on solder ball oxides for reliable contact mating.
This pointed probe works with LGAs, MLFs and other socket types.
Aries' new centre probe socket provides minimal signal loss for higher bandwidth capability via a signal path of only 1.95mm, and its moulded components are UL94V0 Peek and/or Ultem.
All hardware is stainless steel.
Solderless, pressure-mount compression spring probes enable the socket to be easily mounted to and removed from the test board, and leave very small witness marks on the bottom of the device solder balls.
These gold-over-nickel compression spring probes are accurately located by two moulded plastic alignment pins and secured with four stainless steel screws.
The compression spring probes are heat-treated beryllium copper alloy, plated with a minimum of 0.75um gold per MIL-G-45204 over a minimum of 0.75um nickel per QQ-N-290.
Operating temperature of the new centre probe socket is -55 to +150C.
Contact forces are approximately 25g per pin for all pitches.
This makes them capable of testing new Pb-free (RoHS) packages.
Estimated contact life is over 500,000 cycles and contact self-inductance is 0.59nH.
As with all Aries sockets, the new RF test socket is available in custom materials, platings, sizes and configurations to suit specific customer applications.
Pricing for an 1849-lead socket starts at $2449.
Delivery is 4 weeks ARA.
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