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Product category: Stand-Alone Instruments
News Release from: Anritsu (UK) | Subject: Lightning VNA
Edited by the Electronicstalk Editorial Team on 21 May 2003

Analyser aids optoelectronics
characterisation

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A novel test solution provides an extremely cost-effective and accurate method to characterise domain-transfer devices such as optical modulators, photodiodes and photoreceivers.

Anritsu's Microwave Measurement Division has developed a test solution consisting of its Lightning vector network analyser (VNA), a characterised photodiode standard and a laser source that provides an extremely cost-effective and accurate method to characterise domain-transfer devices such as optical modulators, direct modulated lasers, integrated transmitters, photodiodes and photoreceivers The integration of the Lightning VNA, with frequency coverage up to 65GHz, enables the configuration to analyse accurately devices used in 2.5, 10 and 40Gbit/s transmission systems, making the solution both flexible and affordable

The Lightning solution facilitates the measurement of electrical-to-optical (E/O) and optical-to-electrical (O/E) transfer function in terms of bandwidth, flatness, and phase linearity (group delay).

When measuring E/O devices, response of the characterised photodiode is de-embedded from the overall VNA measurement of the E/O, O/E back-to-back configuration.

When measuring O/E devices, the photodiode is used to characterise an E/O standard, and the response is then de-embedded in a similar fashion.

The de-embedding software is internal to the Lightning VNA and provides full on-screen direction, which simplifies calibration and improves measurement throughput.

A 40Gbit/s photodiode standard is available from Anritsu as an accessory for use with this application.

This photodiode is characterised to 65GHz for both magnitude and phase and is traceable to a "golden" standard, characterised by NIST.

Accurate and repeatable measurements are assured because of Lightning's high stability reference.

The VNA has frequency stability of better than 5ppb and frequency resolution of 1Hz as standard.

Its sweep speed of less than 2ms/point is superior to competing offerings as well.

The performance and flexibility of the Lightning VNA make it well suited for a number of other applications in addition to E/O, O/E measurements such as pulsed s-parameter measurements, rise time, and propagation delay measurements.

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