Product category:
ATE Systems
News Release from: Aeroflex | Subject: 5800 Series
Edited by the Electronicstalk Editorial
Team on 07 April 2005
Nepcon demo for budget analogue
in-circuit tester
At Nepcon UK Aeroflex will demonstrate its broad range of test instruments for R and D, product validation, manufacturing test and installation.
At Nepcon UK on Stand G101 Aeroflex will demonstrate its broad range of test instruments for R and D, product validation, manufacturing test and installation, as well as maintenance applications within the communications test, military, government and electronics manufacturing industries Aeroflex will use Nepcon 2005 to show the new Aeroflex 5800 Series of PXI-capable test systems adopting a multi-configuration, multi-strategy methodology and will also showcase the Aeroflex 4500 Series flying probe
This article was originally published on Electronicstalk on 17 Nov 2005 at 8.00am (UK)
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Multiconfiguration, multifunction ATE system is improved with the addition of a boundary scan and Q-test capability along with a PXI software wrapper tool.
In response to market demand for a truly affordable and reconfigurable test system, Aeroflex is developing a combinational tester, with significant functional and high speed analogue in-circuit automatic test capability.
This new product will have configurable software/hardware and pinface styles to accommodate low cost, analogue in-circuit test, through to high integrity LF/RF functional testing.
The Aeroflex 5800 Series is a modular ATE with the unique ability to house Aeroflex and third party modular instrumentation including PXI and GPIB products.
Although the fast analogue in-circuit tester is primarily aimed at the volume manufacturing market, the Aeroflex 5800 will be available in three body styles - a benchtop version to accommodate extremely low cost applications - as well as floor standing and rack-mount options to provide high specification functional test of the type needed for safety critical product testing.
The Aeroflex 4500 flying probe test system provides a comprehensive all-in-one test solution, giving a wide range of capabilities within a fixtureless, cost-effective test environment.
Incorporating the latest linear motion technology, the Aeroflex 4500 offers the best performance for both speed and accuracy of probing.
As well as providing an analogue in-circuit capability, the Aeroflex 4500 also gives the user the capability of performing many other test techniques including optical, power-on testing, digital in-circuit, device programming and functional all in the one test system.
Powerful software tools allow implementation from CAD through to the final test program in the shortest possible time, so important in today's manufacturing environment.
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