Product category:
Stand-Alone Instruments
News Release from: Aeroflex | Subject: 5220
Edited by the Electronicstalk Editorial
Team on 26 July 2006
Dual vacuum control capability for 5220
Aeroflex has announced that a Dual Vacuum Control capability has been added to its 5220 Power Manufacturing Defects Analyser.
Aeroflex has announced that a Dual Vacuum Control capability has been added to its 5220 Power Manufacturing Defects Analyser This new capability allows dual well vacuum test fixtures to be directly controlled by the test system
This article was originally published on Electronicstalk on 3 Oct 2003 at 8.00am (UK)
Related stories
PXI-based platform heralds new wireless strategy
The Aeroflex 3000 series is a PXI-based modular test suite for mobile phone and general-purpose wireless test.
Deeper analysis for broadband signals
Aeroflex has added a broad array of new signal measurement capabilities to its Celerity CS35000 Series broadband signal analyser and recorder family (BSA).
Full backwards compatibility is maintained with existing test programs and fixtures.
Dual Well or 'Chamber' test fixtures can be used to maximise the throughput of a manually operated test system.
The fixture is divided into two halves with each accepting one or more PCB's.
Further reading
Radio tester takes on land mobile radio option
Aeroflex has licensed Trident Micro Systems' Passport protocol for use in its wireless communications test systems.
Software sppeds setup for microwave test systems
Aeroflex has integrated National Instruments' NI TestStand development system into its high-performance synthetic microwave test systems.
While one side of the fixture is testing a PCB, the other half of the fixture can be manually loaded or unloaded.
This innovative capability increases the throughput of the test system by overlapping the test and load times.
Included with immediate effect as a standard feature on all new Aeroflex 5220 Power Manufacturing Defects Analysers, existing systems can be upgraded with the Dual Vacuum Control capability.
Bob Prew, Product Manager, stated, "The new Dual Vacuum Control facility is a capability that users, both new and existing, will find invaluable".
He continued, "Crucial time and subsequent production cost savings can be made with this innovative testing and loading overlap feature".
A fast analog 19 inch rack-mountable test system, the Aeroflex 5220 combines a high 1200 components/sec test speed with the ability to accurately test a wide range of component types, effectively blurring the line between MDA, or analog in-circuit, and full digital in-circuit.
This capability minimises the investment in test systems by reducing the number of platforms required to achieve throughput, and providing the highest level of test coverage within a single manufacturing stage.
The approach of powering up PCBs using either the programmable supplies gives a vast cost advantage over conventional MDA systems, as a higher level of faults can be detected earlier in the production process.
Controlled by an industry standard PC, the Aeroflex test system has a small footprint allowing simple integration into automated in-line manufacturing facilities.
The use of both inductive and capacitive vectorless test techniques contributes to the Aeroflex 5220's ability to generate tests for complex devices quickly and to accurately diagnose faults to enhance productivity and quality.
Aeroflex's 5200 series also incorporates automatic program generation and autodebug facilities, all designed to improve important time to market issues.
• Aeroflex: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page

