Enhancements to PCB test systems on show at Nepcon

Enhancements to PCB testers include new digital functional testing, mixed-signal testing, in-system programming and improved probing speeds.

Aeroflex will launch at Nepcon 2007 (Hall 1, Stand M50) a range of new capabilities and enhancements for its 5800 multiconfiguration, multifunction test system, 4550 flying probe test system and 4250 advanced manufacturing test system.

The Aeroflex 5800 multiconfiguration, multifunction ATE system will be enhanced with a new test capability targeting digital functional-test applications, mixed-signal testing and in-system device programming.

The new digital system is based on a digital test controller board and up to 18 digital testpoint boards giving a maximum digital functional testpoint count of 1152 unmultiplexed I/O channels.

The Aeroflex 5800 series ATE system is a highly flexible, scalable and modular test environment designed to provide the true reconfigurability needed to meet the changing requirements of the rapidly evolving PCB industry.

It features an open hardware and software architecture and reconfigurable pin-face styles to give users the ability to combine digital system testing, low-cost analogue in-circuit testing with a maximum of 3456 test points, high integrity functional testing and systems test all within a single test environment.

Aeroflex will be announcing the addition of soft-landing and partial accessibility capabilities to its 4550 flying probe ATE system.

The soft-landing technique is designed to minimise the potential damage to the 'unit under test' caused by probing.

The partial accessibility capability allows components to be tested even when some of the probes cannot access specific target test points due to component heights or board congestion.

With its ability to perform advanced test techniques including boundary scan, device programming and functional test through an integrated software environment, the Aeroflex 4550 flying probe test system is suitable for prototype applications and also provides the level of throughput required in a production environment.

At 30% faster and lower-cost than Aeroflex's previous generation flying probe system, the 4550's improved probing speed results in greatly enhanced testing throughput which is achieved without compromising probing accuracy and repeatability or the high levels of test coverage made possible by targeting access points down to 75um.

Aeroflex will announce improved boundary scan and device programming capabilities for its flagship 4250 advanced manufacturing ATE system by providing support for JTAG Technologies' JT37 x 7 range of controllers.

The Aeroflex 4250 offers a compact small-footprint design that can be equipped with a maximum of 2048 pure (non-multiplexed) test points.

It provides fast and efficient testing of a wide range of printed circuit boards using analogue and digital in-circuit, boundary scan and functional techniques.

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