Product category:
ATE Systems
News Release from: Aeroflex | Subject: 5800 Series
Edited by the Electronicstalk Editorial
Team on 16 November 2007
ATE system adds boundary scan option
The addition of boundary scan offers 5800 Series users the advantage of structural device, board and system-level test access throughout the whole product lifecycle.
Aeroflex now offers its 5800 Series multiconfiguration, multifunction ATE system with integrated JTAG/boundary scan capabilities The 5800 Series features, as an option, the PXI-based Scanflex platform from Goepel Electronic
This article was originally published on Electronicstalk on 7 Apr 2005 at 8.00am (UK)
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The addition of boundary scan offers 5800 Series users the advantage of structural device, board and system-level test access throughout the whole product lifecycle without the need for invasive bed-of-nail access.
Combining the Scanflex hardware with the 5800's suite of digital cards provides further test coverage for a fully integrated solution.
In addition to the improved test coverage, the benefits of boundary scan include reduced test cost and time to market.
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Boundary scan is commonly used for applications involving extended test and verification, or programming concurrent programmable logic devices or high-speed Flash.
"We are very pleased to be integrating the Scanflex interface hardware into our 5800 Series", says Simon Dawe, ATE Product Manager, Aeroflex.
"The addition of Goepel's efficient, high-speed architecture gives our 5800 Series customers access to professional, integrated boundary scan capabilities, providing them with even greater flexibility and ease of use than ever before".
"Our Scanflex hardware is by far the most innovative system architecture available on the market", says Richard Ainley, Sales Specialist for Goepel Electronics in the UK.
"Scanflex is the only JTAG/boundary scan hardware platform that fully implements the philosophy of extended JTAG/boundary scan in a modular, open and scalable environment".
"Scanflex is a perfect fit for Aeroflex's 5800 Series in mid-range and high-end performance applications".
The integrated Goepel hardware consists of a controller, a TAP (test access port) transceiver, TAP interface card (TIC) and distributed I/O modules.
The Scanflex hardware will offer extended fault coverage for the 5800 Series by using digital and analogue I/O modules, and the 5800 Series' digital suite of cards.
The controller's architecture supports datarates of up to 80MHz on up to eight independent TAPs.
The 5800 Series is an easy-to-use digital ATE system that integrates seamlessly with an analogue suite to provide mixed signal testing as well as pure digital functional test.
The system is based on a digital test controller board and up to 18 digital testpoint boards, giving a maximum digital functional testpoint count of 1152 unmultiplexed I/O channels.
With its flexible, scalable and modular test environment, the 5800 Series features an open hardware and software architecture and reconfigurable pin-face styles, allowing users to perform digital system testing, low-cost analogue in-circuit testing with a maximum of 3456 test points, high integrity functional testing and systems test - all within a single test environment.
This saves floor space, reduces board-handling damage and lowers the cost of test.
The system's digital test controller board features a 10MHz test step rate, trigger generation and response, four pattern generators and 5ns edge placement.
The digital testpoint card provides 64 channels, configurable drive and monitor levels and 1152 digital test channels.
Three different body styles make up the 5800 Series - floor standing (5850), benchtop (5820) and rack-mount (5830).
Each body style has a common core of 21-slot rack, power and utility cards.
The boundary scan option is available now for order on the 5800 Series.
A starting configuration for the 5800 digital test controller is priced at approximately US $4800 and the Scanflex boundary scan option will start at approximately US $2700.
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