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Product category: Test Accessories
News Release from: Ardent Concepts | Subject: Redundant Contact LGA contactors
Edited by the Electronicstalk Editorial Team on 04 May 2004

Contact technology switches to processor
testing

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Ardent Concepts has begun shipping high-performance LGA contactor solutions based on its novel Redundant Contact technology.

Ardent Concepts has begun shipping high-performance LGA contactor solutions based on its novel Redundant Contact technology "With a solid footing in the RF device test market, the next logical application for our solution was LGA-style processors", says Steve Cleveland, Ardent Concepts Vice President for Business Development

"Our customer needed a reliable testing solution for ceramic packages with over 1000 I/Os.

The short test height, high speed capability and consistent resistance of the Redundant Contact architecture provide them with a durable, flexible contactor solution".

The all-metal Redundant Contact technology offers electrical invisibility with a measured self-inductance of 0.5nH and a -1dB insertion loss at 24GHz and a -3dB bandwidth over 30GHz in 0.5mm pitch configuration.

The Redundant Contact achieves low contact resistance by using a low surface area contact patch.

This allows engineers to design high-node-count interconnections without high levels of contact force.

The Redundant Contact can accommodate a wide variety of applications in area array and peripherally leaded interconnect designs.

The Redundant Contact can achieve pitches of 0.25mm, and is capable of Kelvin contacting on 0.5mm pitch devices.

The contact technology is ideal for RF testing of various package types including QFN packages, PCB to PCB as well as all other chip scale, flip chip, substrate and other packaged IC interconnections.

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