<?xml version="1.0" encoding="iso-8859-1"?>
<rss version="2.0">
  <channel>
    <title>RSS News Feed for Asset InterTech - from Electronicstalk</title>
    <link>http://www.electronicstalk.com/news/asn/asn000.html</link>
    <description>Asset InterTech news releases on Electronicstalk</description>
    <language>en-gb</language>
    <copyright>Copyright (C)2008 Pro-Talk Ltd. All rights reserved.</copyright>
    <pubDate>Sat, 22 Nov 2008 08:00:00 UT</pubDate>
    <lastBuildDate>Sat, 22 Nov 2008 08:00:00 UT</lastBuildDate>
    <image>
      <title>Pro-Talk Ltd</title>
      <url>http://www.pro-talk.com/images/protalklogo90.gif</url>
      <link>http://www.pro-talk.com/</link>
      <width>90</width>
      <height>79</height>
    </image>
    <item>
      <title>MicroMater license available in two configurations</title>
      <description>Following a licensing arrangement, the capabilities of Asset Intertech's MicroMaster e-JTAG CPU emulation functional test and debug system can be deployed by global enterprises.</description>
      <pubDate>Wed, 29 Oct 2008 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn124.html</link>
    </item>
    <item>
      <title>Test platform works with embedded serdes</title>
      <description>Asset InterTech is modifying its ScanWorks platform for open embedded instrumentation tools to support Avago Technologies' embedded instrumentation technology for ASICs.</description>
      <pubDate>Wed, 20 Aug 2008 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn123.html</link>
    </item>
    <item>
      <title>System managers support boundary scan</title>
      <description>ScanWorks can be used with Maxim's MAX16031 and MAX16032 system monitors and MAX16046-MAX16049 system managers through the devices' IEEE1149.1 interfaces.</description>
      <pubDate>Wed, 13 Aug 2008 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn122.html</link>
    </item>
    <item>
      <title>Diagnostic system supports new Intel chips</title>
      <description>MicroMaster allows design and manufacturing engineers to apply powerful functional test and diagnostic routines to circuit board designs featuring Nehalem or Tolapai processors</description>
      <pubDate>Wed, 18 Jun 2008 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn120.html</link>
    </item>
    <item>
      <title>Emulator is first to support Intel's Atom</title>
      <description>uMaster and Asset's ScanWorks platform can help manufacturers identify faults early in the design cycle, improving prototype yields and accelerating time to market.</description>
      <pubDate>Wed, 02 Apr 2008 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn119.html</link>
    </item>
    <item>
      <title>Acquisition unites test technologies</title>
      <description>The complementary technologies of Asset and ITT furthers the convergence of Asset's JTAG-based structural test technology and ITT's functional testing capabilities.</description>
      <pubDate>Wed, 05 Dec 2007 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn118.html</link>
    </item>
    <item>
      <title>Boundary-scan system supports Intel's IBIST</title>
      <description>IBIST leverages the boundary-scan IEEE1149.1 specification as the hardware and software communication methodology for accessing and controlling its embedded on-chip capabilities.</description>
      <pubDate>Wed, 24 Oct 2007 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn117.html</link>
    </item>
    <item>
      <title>Lab assesses designs for testability</title>
      <description>Design-for-test lab reduces the time to market for new products by identifying JTAG testability issues before prototypes are assembled.</description>
      <pubDate>Wed, 14 Feb 2007 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn116.html</link>
    </item>
    <item>
      <title>Boundary-scan system opens up to third parties</title>
      <description>Asset InterTech has enhanced its ScanWorks boundary-scan (JTAG) system, increasing its openness to third-party technologies and products.</description>
      <pubDate>Tue, 17 Oct 2006 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn115.html</link>
    </item>
    <item>
      <title>Boundary-scan controller adds functional test</title>
      <description>Controller card can apply both JTAG and functional microprocessor emulation tests on the same circuit board.</description>
      <pubDate>Mon, 09 Oct 2006 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn114.html</link>
    </item>
    <item>
      <title>Malaysian office provides boundary-scan support</title>
      <description>Asset InterTech has established a Southeast Asian boundary-scan technology centre in Penang, Malaysia.</description>
      <pubDate>Mon, 18 Sep 2006 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn113.html</link>
    </item>
    <item>
      <title>Motorola standardises on boundary scan systems</title>
      <description>Asset InterTech has signed a multiyear contract to become Motorola's worldwide supplier of boundary scan (IEEE1149.1 or JTAG) electronic test systems.</description>
      <pubDate>Mon, 17 Jul 2006 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn112.html</link>
    </item>
    <item>
      <title>System-level JTAG demo to prove concept</title>
      <description>Asset InterTech and Firecron will demonstrate system-level JTAG test and programming in a proof-of-concept system at the upcoming European Board Test Workshop.</description>
      <pubDate>Mon, 22 May 2006 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn111.html</link>
    </item>
    <item>
      <title>Shanghai is central to Asset in Asia</title>
      <description>Asset InterTech has launched its own boundary-scan technology centre in Shanghai, China.</description>
      <pubDate>Wed, 08 Mar 2006 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn110.html</link>
    </item>
    <item>
      <title>Analyser picks up magazine award</title>
      <description>Asset InterTech's DFT Analyzer has been honoured with a "Best In Test" award from Test and Measurement World.</description>
      <pubDate>Tue, 03 Jan 2006 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn109.html</link>
    </item>
    <item>
      <title>Online boundary-scan validation service launched</title>
      <description>Asset InterTech has announced an online service that validates the accuracy of boundary scan description language files that describe the boundary-scan characteristics of semiconductor devices.</description>
      <pubDate>Tue, 29 Nov 2005 08:00:00 UT</pubDate>
      <category>Asset InterTech</category>
      <link>http://www.electronicstalk.com/news/asn/asn107.html</link>
    </item>
  </channel>
</rss>
