Product category:
Design and Development Software
News Release from: Asset InterTech | Subject: ScanWorks
Edited by the Electronicstalk Editorial
Team on 24 February 2005
Agilent integrates JTAG test system
Agilent Technologies has seamlessly integrated ScanWorks, a JTAG test system from Asset InterTech, into its new next-generation in-circuit test (ICT) system, the Medalist i5000.
Agilent Technologies has seamlessly integrated ScanWorks, a JTAG test system from Asset InterTech, into its new next-generation in-circuit test (ICT) system, the Medalist i5000 In addition, Agilent features ScanWorks as the premier JTAG bundled solution on its Medalist ICT product line, including the i5000 and 3070 Series systems
This article was originally published on Electronicstalk on 20 Aug 2008 at 8.00am (UK)
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Test platform works with embedded serdes
Asset InterTech is modifying its ScanWorks platform for open embedded instrumentation tools to support Avago Technologies' embedded instrumentation technology for ASICs.
System managers support boundary scan
ScanWorks can be used with Maxim's MAX16031 and MAX16032 system monitors and MAX16046-MAX16049 system managers through the devices' IEEE1149.1 interfaces.
Agilent now refers to its boundary-scan solution as Medalist ScanWorks.
"When we partnered with Asset and integrated their ScanWorks tools into our 3070 product more than three years ago, we were making a commitment to bring the "best-in-class" boundary-scan solution to our customers", said Marty Leeke, Agilent ICT Product Manager.
"Our commitment continues with the i5000".
Further reading
Emulator is first to support Intel's Atom
uMaster and Asset's ScanWorks platform can help manufacturers identify faults early in the design cycle, improving prototype yields and accelerating time to market.
Boundary-scan system supports Intel's IBIST
IBIST leverages the boundary-scan IEEE1149.1 specification as the hardware and software communication methodology for accessing and controlling its embedded on-chip capabilities.
"In Medalist ScanWorks, users of any Agilent ICT systems have a JTAG system that is truly powerful in terms of its test coverage and speed of test application for high-volume manufacturing operations".
"At the same time, it's very easy to learn and use".
ScanWorks is currently used by leading electronics companies such as Cisco, Lucent Technologies, Agilent, BAE, Alcatel, Hewlett-Packard, Ericsson, Intel, Raytheon, SBS, Solectron, Rockwell Collins, EMC and others.
"By continuing the integration of ScanWorks with its ICT systems, Agilent is able to offer its ICT users the efficiency of re-using boundary-scan tests across the entire life cycle of a product", said Alan Sguigna, Asset's Vice President of Sales and Marketing.
"JTAG design validation tests generated on a ScanWorks benchtop station during a product's development phase can be re-used in high-volume manufacturing on ICT systems with Medalist ScanWorks".
"And later, these same boundary-scan tests can migrate to field service and repair operations, reducing the cost of test development and increasing overall productivity".
"All Medalist ScanWorks tests are fully compatible with both the i5000 and the 3070 platforms".
The Medalist ScanWorks solution bundles ScanWorks with Agilent's Interconnect Plus boundary-scan tool and Silicon Nails, which works with boundary-scan chains to automatically test non-boundary-scan devices.
Users can migrate tests from a ScanWorks station in their design departments to manufacturing, where the tests can be merged with Silicon Nails tests, for example.
This coordinated test suite can then be applied on an Agilent Medalist ICT system.
A test suite containing both ScanWorks and Silicon Nails tests will achieve higher test coverage than either test type could on its own.
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