Probe needles offer high electrical conductivity

Edited by the Electronicstalk editorial team Feb 17, 2003

Designed for use in wafer and hybrid test applications, the Atek Technology range of probe needles offers high electrical conductivity and flexural strength as well as corrosion and wear resistance.

Designed for use in wafer and hybrid test applications, the Atek Technology range of probe needles offers high electrical conductivity and flexural strength as well as corrosion and wear resistance.

Featuring a nickel-plated finish, the probes are made from tungsten or tungsten-rhenium to provide the required hardness for a precise contact, onto aluminium pads are used.

Even after many cycles, these rugged, reliable needles exhibit minimum tip wear and offer a longer service life.

In addition they afford greater penetration into the oxide coating of aluminium pads during contacting.

The Atek range comprises needle diameters from 7 to 14mm in lengths from 1250 to 2000mm, with taper lengths and round tip diameters from 80 to 150mm and 1.0 to 8.0mm.

Tip drops are available from 7 to 220mm and tip angles from 61 to 83 degrees.

Straight needles, flat tips and other materials, including BeCu and Trivar, can also be supplied.