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Product category: Test Accessories
News Release from: Atek Technology | Subject: Specialist test probes and receptacles
Edited by the Electronicstalk Editorial Team on 24 June 2003

Test probes cover special applications

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Atek Technology has released a number of specialist test probes and receptacles for use in loaded and bare boards as well as in industrial and pneumatic applications.

Atek Technology has released a number of specialist test probes and receptacles for use in loaded and bare boards as well as in industrial and pneumatic applications Offered alongside new, high-performance semiconductor packages in ceramic and metal, these high-performance, high-specification products are the direct result of the Atek product sourcing service

Designed to solve the problems associated with those "hard to find" products, the Atek product sourcing service is free of charge and reflects Atek's specialist experience of more than 30 years in electronics materials and piece parts.

Special tipped probes, including nonrotating blades for testing connector blocks and multiple tipped probes which allow a larger range of tolerances on the test pad, are an example of the specialist probes that are available.

Coaxial probes for higher-frequency applications are also popular as they allow the testing and set up of RF circuits prior to final assembly.

A combination of tip style and travel with carefully controlled spring forces has also resulted in a number of successful applications in the automotive area.

Using the latest in ceramic design and lightweight, high thermal packaging concepts along with conventional glass to metal seal technology, the Atek range of cost effective ceramic and metal packages can be produced quickly and efficiently.

Meeting the needs of high power semiconductor, microelectronic and high speed communications applications, they are ideal for use in fibre-optic communications, launchers, detectors and other active systems, high power devices and hybrid systems.

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