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News Release from: Board Test Workshops
Edited by the Electronicstalk Editorial
Team on 03 January 2007
Board test workshop calls for papers
Hard on the heels of the successful and informative 2006 European BTW comes the call for papers for the 2007 event, which is headed for Germany for the first time.
Hard on the heels of the successful and informative 2006 European BTW (EBTW), held in Southampton, UK comes the call for papers for the 2007 event, which is headed for Germany for the first time Scheduled for 24th and 25th May 2007, the EBTW event will be held in association with the 2007 European Test Symposium in Frieburg, Germany, close to the Basle on the Swiss and French borders
This article was originally published on Electronicstalk on 8 Nov 2004 at 8.00am (UK)
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The event is focused on current issues and trends related to board (PCB) and system test.
In common with earlier EBTWs, perspectives are invited from contract manufacturers, test equipment providers, researchers, end-users and systems providers.
Technical papers are invited on a variety of topics from the following lists and a full schedule of events will be presented on the EBTW website.
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Key dates for submissions and review are as follows.
Full papers or extended abstracts must be submitted by 25th February 2007, and notification of acceptance will be sent by 15th April 2007.
Final papers are due by 13th May 2007.
Visitors can register for the event now on the website, with early booking discounts available and reductions for IEEE members.
Papers may be submitted on the following topics or other relevant industry areas: traditional board test techniques; boundary scan-based test techniques; assessing BSDL compliance and accuracy; board test - structural versus functional test; parametric testing; onboard built-in self-test techniques; electrical, optical and X-ray board test mix; board test for high-volume consumer products; Advances in flying probe technology; creating board functional tests; advances in ICT fixturing; interfacing test flows with manufacturing flows; board test - linking ICT with low-cost PC testers; board test - fault-coverage metrics; board test - reducing false fails; applications of VXI/PXI plug and play technology; system-level and field-service test; using 1149.1 as a backplane test-bus; 1149.1 backplane test-bus support devices; systems design integration and test issues; field servicing: test needs and solutions; new standards and new problems; practical use of P1581; advances in 1149.6 AC-Extest; advances in 1149.4 mixed-signal test bus; test techniques for serdes boards; at-speed board and system structural test; outsourcing to EMS companies - issues and solutions; re-using prototype tests in volume manufacturing; in-system configuration; onboard programmability of CPLDs/FPGAs; how to program PLDs to execute test functions; board test economics; and emulation in a field-service environment.
EBTW07 is sponsored by the IEEE Computer Society - Test Technology Technical Council (TTTC) and supported by the IEEE Board Test Technology Activities Committee (BTTAC).
Industry sponsors include JTAG Technologies, Firecron, Goepel, Asset Intertech and International Test Technologies.
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