Product category:
Design and Development Software
News Release from: Cadence Design Systems | Subject: Encounter True-Time Test
Edited by the Electronicstalk Editorial
Team on 27 October 2006
Test software improves 90nm delay defect
coverage
Azul Systems has directed its manufacturing test generation development process to Cadence Encounter True-Time Test ATPG solution.
Azul Systems, a leader in enterprise server appliances that deliver compute and memory resources as a shared network service, has directed its manufacturing test generation development process to Cadence Encounter True-Time Test ATPG solution Encounter Test joins both Encounter RTL Complier global synthesis and Encounter Conformal Equivalence Checker products in the Azul Systems design flow
This article was originally published on Electronicstalk on 23 Jun 2006 at 8.00am (UK)
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Encounter Test, a key technology in the Cadence Encounter digital IC design platform, delivers the industry's most advanced test solution from RTL to silicon.
It includes three component technologies: Encounter Test Architect, to minimise cost of test; Encounter True-Time Test, to ensure quality of shipped silicon; and Encounter Diagnostics, to accelerate yield ramp.
The Cadence Encounter True-Time Test ATPG solution allows Azul to perform higher quality manufacturing tests, which detects small delay defects common in 90nm devices.
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Encounter True-Time Test is unique within the industry as it includes a robust onboard timing engine.
True-Time uses actual post-layout circuit-timing data from the Standard Delay File (SDF) to automatically generate timing-accurate patterns including faster-than-at-speed tests.
Faster-than-at-speed tests have been able to identify small delay defects - slow rise/fall signals - which other tools often miss.
True-Time also creates test sequences for complex multicycle timing paths without significant user intervention, which is essential for characterising devices with complex clocking architectures.
"We recently chose to enhance our DFT methodology with Encounter True-Time Test ATPG as it provided us with higher test coverage for static and delay defects enabling higher product quality while at the same time lowering our test costs", said Scott Sellers, Chief Operating Officer and Cofounder at Azul Systems.
"Up to now small delay defects and complex multi-cycle paths have been challenges for us at Azul".
"Encounter True-Time Test has performed very well in these areas on our most complex designs".
"We are very confident Encounter True-Time Test ATPG will markedly impact our quality and costs".
"Azul compute appliances require high quality and maximum uptime", said Sanjiv Taneja, Vice President of R and D for Encounter Test at Cadence.
"The adoption of Encounter Test with its ability to find the smallest delay faults enables Azul Systems to meets these critical business objectives".
"The Encounter Test team looks forward to continue working with Azul Systems in the upcoming year to further improve their product quality with True-Time".
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