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News Release from: Cambridge Technology Systems | Subject: Compound optical microscopy
Edited by the Electronicstalk Editorial
Team on 01 February 2007
Microscopes analyse LSI devices
Imaging large scale integrated devices for design and diagnostic purposes is facilitated by new mosaic automation techniques applied to compound optical microscopy.
Imaging large scale integrated devices for design and diagnostic purposes is facilitated by new mosaic automation techniques applied to compound optical microscopy It is important that the highest possible resolution of detail is related precisely within the overall structure of the device under examination and recorded for repeated reference at any time
This instrumentation is now available in a modular form to cater for the user's requirements at the minimum possible cost consistent with the overall performance specification.
Recent techniques to be added to the range of facilities include three dimensional focus stack imaging, time lapse recording of any selected points and precise three dimensional measurement.
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