Online summit to address test automation issues

Edited by the Electronicstalk editorial team Apr 13, 2007

Conduant will present a paper on "Choosing the right data streaming architectures for PXI systems" during the 2007 NI online Automated Test Summit.

Conduant Corp is a Gold Sponsor for National Instruments' online Automated Test Summit 2007 scheduled for 8th May.

The Automated Test Summit will feature technical sessions focused on identifying trends and overcoming new challenges in automated test.

As a sponsor, Conduant will present a paper entitled "Choosing the right data streaming architectures for PXI systems".

"High-speed data recording and playback is becoming an increasingly important part of test and measurement systems", said Ken Owens, Conduant CEO.

"The PXI platform, because of its high-bandwidth backplane, is ideal for data streaming".

"The Conduant presentation will address what bottlenecks exist in high-speed data recording and playback systems, and what can be done to overcome them".

The Automated Test Summit 2007 will be hosted live on the Internet on 8th May, and will be available on demand for 90 days.

Engineers will be able to learn best practices in test development at their convenience.

At the free full-day event, delegates can view keynote presentations, watch technical sessions, participate in live Q and A forums and interact with vendors in the exhibitor area.

Participants can register online and find a full list of technical sessions at the Conduant website.