Product category:
Design and Development Software
News Release from: Celestry | Subject: AgeMOS
Edited by the Electronicstalk Editorial
Team on 15 July 2002
Reliability model allows for hot carrier
injection
AgeMOS is a novel a universal model for accurate reliability modelling during deep-submicron CMOS circuit simulation.
New from Celestry Design Technologies, AgeMOS is a novel a universal model for accurate reliability modelling during deep-submicron CMOS circuit simulation In addition, Celestry has released tools and services that support model development and reliability modelling options for its transistor-level circuit simulators
This article was originally published on Electronicstalk on 19 Oct 2001 at 8.00am (UK)
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AgeMOS models enable the flexibility to incorporate new degradation mechanisms of transistor degradation into the circuit simulation.
It is more accurate than previous generations of reliability models.
They work with popular transistor-level circuit simulators, like Celestry's UltraSim, a multi-million transistor simulator.
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"The AgeMOS model enhances our position as the leader in modelling and reliability analysis, said Randy Smith, Vice President of Marketing at Celestry.
"The model's flexibility allows customers to use AgeMOS models in their 0.13 micron flows as well as in future very deep submicron flows".
Smith also remarked, "We are currently working with several semiconductor manufacturers, who will support AgeMOS models in their cell-based flows".
Celestry's AgeMOS model offers reliability analysis for HCI (hot-carrier injection) and NBTI (negative bias temperature instability) effects to improve performance and yield.
The AgeMOS modelling methodology allows designers to select the best level of accuracy for their application, and use techniques to design more aggressively without overly pessimistic design guard bands.
The AgeMOS model is a universal model that works with any Spice or Spice-compatible simulator.
Celestry's AgeMOS model generation tools include RelPro+ for collecting stressed device data and BSIMPro+ for model parameter extraction.
Celestry's circuit simulators that support AgeMOS models for block and full chip simulation are RelXpert and UltraSim, respectively.
HCI degradation slows down circuit speeds, potentially causing circuit-operating failures.
HCI arises as a result of the aggressive scaling of device geometries, most notably for short device channel lengths.
NBTI is a failure mechanism that degrades the dynamic range, distortion and matching of an analogue circuit during high temperature operation, such as burn-in.
NBTI degradation is a critical reliability issue for chip processes using ultra thin gate insulators, and can prevent a chip designer from relying on the expected performance of the process before NBTI stressing.
The AgeMOS option for Celestry's simulators starts at US $30,000 and is available now.
Celestry Labs also offers services for generating AgeMOS models.
(This was Electronicstalk's Top Story on 12 July 2002).
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