Nadir to engineer structured ASIC advances
Ophir Nadir is the new Vice President of Engineering and R and D at ChipX.
Structured ASIC specialist ChipX has appointed Ophir Nadir as Vice President of Engineering and R and D.
Nadir brings a wealth of experience to the role, and will help ensure that ChipX continues to deliver structured ASICs that have a high gate density and are much lower cost when compared with other structured ASICs and programmable devices.
Nadir has nearly 14 years of experience in the ASIC and standard cell industry and now leads ChipX's R and D centre in Haifa, Israel and its Design Services Group in Santa Clara, California.
Prior to joining ChipX, Nadir served as the Switching Product Design Director for Marvell, one of the leading global semiconductor providers of complete broadband communications and storage solutions.
Nadir has also held engineering and managerial positions at Galileo Technologies, Qualcomm and IBM.
He comments: "ChipX serves customers throughout the electronics industry, including those in the networking and telecommunications, consumer and PC peripheral markets".
"Our mission is to provide a complete ASIC time-to-market solution featuring flexible production and a smooth migration from prototyping to cost-competitive, high-volume production".
"We will continue to develop leading performance, low NRE and fast turnaround time structured ASICs, providing customers with a real alternative to slow and large FPGAs or high risk ASIC solutions".
Nadir holds a BSc in electrical engineering (cum laude) from the Technion, Israel Institute of Technology, and an MBA from the Recanati Business school at the Tel Aviv University.
Not what you're looking for? Search the site.
Categories
- Active Components (11,917)
- Passive Components (2,949)
- Design and Development (9,394)
- Enclosures and Panel Products (3,246)
- Interconnection (2,841)
- Electronics Manufacturing, Production, Packaging (3,055)
- Industry News (1,898)
- Optoelectronics (1,616)
- Power Supplies (2,297)
- Subassemblies (4,551)
- Test and Measurement (4,956)
