Probes to test RF and CMOS circuits

Edited by the Electronicstalk editorial team Apr 27, 2007

Maker of RF and BiCMOS products invests in Pyramid Probe cards for advanced testing of products.

Peregrine Semiconductor has placed a multimillion dollar order for Cascade Microtech's Pyramid Probe cards to be used in its advanced RF CMOS integrated-circuit production.

The probe cards, which have begun to ship to Peregrine, will be used to test Peregrine's latest generation UltraCMOS high-power antenna switches.

According to Peregrine, Cascade Microtech was selected due to the high quality advanced RF performance and reliability of its production probe card solutions.

"With mobile wireless and broadband applications driving much of today's demand for our communication ICs, it is important that we are able to manufacture and test cost- effectively large volumes of RF CMOS devices", says Vince DeMaioribus, Director of Assembly and Test operations, Peregrine Semiconductor.

"Cascade Microtech has been a valued supplier in providing high-performance probe cards and dedicated support to help enable testing of our advanced RF CMOS integrated circuits".

"Our Pyramid Production Probe solution is engineered to address the fundamental challenges associated with high-performance RF CMOS device probing".

"Our production probe cards provide our customers with state-of-the- art electrical and mechanical performance, global support and short lead times to reduce time to market and lower total cost of test", says Cascade Microtech CEO, Eric Strid.

"We are pleased that Peregrine has chosen to work with us in testing their newest generation UltraCMOS antenna switches".