Product category:
ATE Systems
News Release from: Cupio | Subject: Qmax V200
Edited by the Electronicstalk Editorial
Team on 18 March 2005
Brighton debut for desktop ATE
For the first time in the UK, Cupio is presenting the latest in desktop ATE technology from Qmax at this year's Nepcon show.
For the first time in the UK, Cupio is presenting the latest in desktop ATE technology from Qmax at this year's Nepcon show The V200 test system combines the ease of clip or edge connector and JTAG test with the power of a versatile VHDL simulator to quickly fault-find any circuit board with analogue, digital, VLSI or combinational technologies
This article was originally published on Electronicstalk on 21 Mar 2005 at 8.00am (UK)
Related stories
High throughput claims for robotic copy station
Available now from Cupio is the first fully automated copying station worldwide that can be used to copy data to large quantities of memory cards.
Nepcon debut for in-circuit tester
The QT2128-320PXI was developed to address testing of the new generation of printed circuit assemblies where access to the board is restricted.
VHDL simulation on a clip access tester is a major step forward allowing, for the first time, functional testing of complex bus based components without the need for detailed, low level programming which can take weeks to achieve.
At the same time this technique allows for edge connector driven functional testing with a guided probe for accurate fault identification.
The V200 facilitates the integration of third party simulators and the use of other simulator based techniques such as boundary scan.
True board based boundary scan gives easy and quick testing of otherwise inaccessible components such as BGA and flip-chip packages.
"We have selected Nepcon for the European debut of the V200", commented Rajkumar Clement, Qmax International Development Manager, "because it fits the profile of our target market for both repair and manufacturing".
Bringing this type of diagnostic power to the repair market will move the application of this class of test past the support of legacy or obsolescent boards and on to new VLSI technologies, including processor based boards.
The V200 is a cost effective mini-ATE system, designed to cater for the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them offline.
It provides a complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FBGA and VLSI chips.
The V200 is a combinational mixed signal test system with the addition of board and component based boundary scan test for the latest generation of components.
It incorporates a number of test interface techniques including: card edge functional test for both digital and analogue, in-circuit functional test for localised test of individual devices including LSI/VLSI/memory and microprocessors and the powerful advanced QSM VI with user definable wave patterns.
• Cupio: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page
Search the Pro-Talk network of sites
