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Product category: Stand-Alone Instruments
News Release from: Exfo Electro-Optical Engineering | Subject: FLS-2200
Edited by the Electronicstalk Editorial Team on 28 March 2003

Broadband light sources aid
characterisation

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FLS-2200 broadband light sources enable test engineers to characterise CWDM networks, passive optical networks and optical components.

The FLS-2200 broadband light source series, a suite of next-generation superluminescent, light-emitting diode (SLED) benchtop units, have been specifically designed to enable test engineers to characterise coarse wavelength division multiplexing (CWDM) networks, passive optical networks (PONs) as well as optical components The FLS-2200 light sources generate high power density (better than -30dBm/nm) and excellent power stability to allow point-to-point testing of CWDM and dense wavelength division multiplexing (DWDM) networks as well as characterisation of components in all wavelength bands

Test engineers can measure insertion loss as a function of wavelength, as well as continuity of a link through a multiplexer, when combined with an optical spectrum analyser (OSA).

Typical devices tested include PON components, CWDM components, Bragg gratings, attenuators, photonic switches, broadband couplers, specialty couplers or multiplexers, isolators, circulators, hybrid components and depolarisers.

EXFO's broadband sources are available in two different models.

The basic source contains a single SLED that covers a conventional wavelength range centred around 980, 1310, 1480, 1550 or 1620nm.

The second type includes two SLEDs covering a wider range (1460 to 1625nm) for CWDM and dual-window (1310/1550nm) applications.

This new family of sources completes EXFO's broad offering in modular and benchtop formats, for single-mode and multimode applications, including tunable lasers, distributed feedback (DFB) lasers, Fabry-Perot lasers, light-emitting diodes (LEDs) and amplified spontaneous emission (ASE) sources.

"Our new broadband light sources provide customers with a wide range of solutions for their optical network and component testing requirements", said Etienne Gagnon, Director of Product Management at EXFO.

"We have all the wavelength bands covered with our single- and dual-SLED benchtop units for accurate and cost-effective characterisation".

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