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Solis expands analytical expertise

Edited by the Electronicstalk editorial team Jan 9, 2004

The recent addition of Paco Solis as Lead Investigator for Foresite enhances the laboratory's capabilities.

The recent addition of Paco Solis as Lead Investigator for Foresite enhances the laboratory's capabilities.

His cross-sectioning expertise also complements the ion chromatography and SIR testing services that Foresite offers.

Solis claims: "Foresite offers an opportunity to work with the laboratory on a daily basis applying my analytical skills and experience to solve customer problems.

I also have developed a great deal of trust and respect over the years for company President, Terry Munson, and am glad to be a part of his team".

Solis possesses a seasoned 15-year background in semiconductor failure analysis, as well as 4 years in a high-pressure design pool.

His specialty in cross-sectioning of chips serves several functions.

Cross-sectioning allows an intricate look at stack-up structures, PC board plating thickness, adhesion, interconnection analysis, and mechanical failures.

The deepest levels of the interconnection hierarchy within a chip can be easily characterised.

Foresite President Terry Munson says: "Solis's process knowledge of wafer fabrication and component packaging is vast.

He adds the technical expertise in cross-sectioning and surface analysis (SEM / EDX) to solve the problems for clients on solderability and lead-free soldering issues".