Cleanliness analyser patented in China

A Foresite product story

Edited by the Electronicstalk editorial team Mar 3, 2005

The novel C3 cleanliness analyser has been granted a Chinese patent to add to those already held in the UK and USA.

The novel C3 cleanliness analyser has been granted a Chinese patent to add to those already held in the UK and USA.

There are also patents pending in Germany and Hong Kong.

The C3 is designed to be used for real time cleanliness analysis in the manufacturing facility.

Having access to this information during the production process saves valuable time and money by allowing the customer to remedy problems early in the product's production.

Using a steaming technique, residues in the specified area are extracted and then tested electrically for conductivity and corrosivity.

This process serves two purposes: first as a localised residue assessment tool and second as a sample collection tool for ion chromatography analysis when further investigation is required.

Within minutes, this test will offer results on the cleanliness of the surface.

The C3 goes beyond ionic bulk resistivity testers, testing specific areas and pinpointing the location of the residue without exposing the entire board to water which can dilute test results.

The test is localised to an area of 0.1in2 allowing the user to know exactly where the residue issue is occurring.