<?xml version="1.0" encoding="iso-8859-1"?>
<rss version="2.0">
  <channel>
    <title>RSS News Feed for Goepel Electronic - from Electronicstalk</title>
    <link>http://www.electronicstalk.com/news/gpe/gpe000.html</link>
    <description>Goepel Electronic news releases on Electronicstalk</description>
    <language>en-gb</language>
    <copyright>Copyright (C)2008 Pro-Talk Ltd. All rights reserved.</copyright>
    <pubDate>Fri, 25 Jul 2008 08:00:00 UT</pubDate>
    <lastBuildDate>Fri, 25 Jul 2008 08:00:00 UT</lastBuildDate>
    <image>
      <title>Pro-Talk Ltd</title>
      <url>http://www.pro-talk.com/images/protalklogo90.gif</url>
      <link>http://www.pro-talk.com/</link>
      <width>90</width>
      <height>79</height>
    </image>
    <item>
      <title>PCI Express slots are put to the test</title>
      <description>Boundary scan I/O modules enable structural test of PCI Express slots via IEEE1149.6.</description>
      <pubDate>Wed, 23 Jul 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe175.html</link>
    </item>
    <item>
      <title>PXI controllers take transceivers onboard</title>
      <description>The new boundary scan controllers incorporate the normally external Scanflex TAP transceivers into a single-slot 3U unit.</description>
      <pubDate>Thu, 03 Jul 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe174.html</link>
    </item>
    <item>
      <title>Inspection system monitors PCB quality</title>
      <description>The 20Mpixel camera module for top inspections enables a microscopic resolution with telecentric image recording in an inspection area of about 170mm.</description>
      <pubDate>Wed, 11 Jun 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe173.html</link>
    </item>
    <item>
      <title>I/O module at the point of interface testing</title>
      <description>The Cion Module/FXT114S is highly suitable for the test of nonscannable circuit clusters, peripheral connectors, backplanes and AC-coupled networks.</description>
      <pubDate>Wed, 02 Apr 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe172.html</link>
    </item>
    <item>
      <title>Boundary scan gains flexible analogue interface</title>
      <description>Module features eight independent analogue I/O channels with additional digital resources and supports application specific in-system reconfiguration.</description>
      <pubDate>Fri, 28 Mar 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe171.html</link>
    </item>
    <item>
      <title>Technology provides integrated emulation</title>
      <description>The use of pre-assembled VarioTAP standard models removes the need for the user to have specific background knowledge and processor-specific pods.</description>
      <pubDate>Fri, 29 Feb 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe170.html</link>
    </item>
    <item>
      <title>Boundary scan is optimised for flying probes</title>
      <description>Tools enable an unrivalled level of interaction between flying probe access and boundary scan access for board level test applications, embracing all phases of IEEE1149.1 applications.</description>
      <pubDate>Mon, 11 Feb 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe169.html</link>
    </item>
    <item>
      <title>I/O modules check out memory interfaces</title>
      <description>Low-cost digital module enables the testing of all signal and voltage supply pins of JEDEC-compliant DDR2 Mini DIMM 244 sockets.</description>
      <pubDate>Thu, 07 Feb 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe168.html</link>
    </item>
    <item>
      <title>MOST communications put to the test</title>
      <description>The PXI 3060 and basicMOST 3060 have been designed for communication applications in general test and measurement technologies, in particular for vehicle control units.</description>
      <pubDate>Fri, 18 Jan 2008 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe167.html</link>
    </item>
    <item>
      <title>Teradyne board tester gains boundary scan</title>
      <description>Cascon Galaxy can access and use the probes in the Spectrum 8800 bed-of-nails adapter for driving and measuring circuit nodes.</description>
      <pubDate>Mon, 26 Nov 2007 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe164.html</link>
    </item>
    <item>
      <title>Relay matrix for cost-effective test setups</title>
      <description>Both the basicCON 3132 and USB 3132 provide 32 relays with a maximum switching voltage of 100V DC and a maximum switching current of 1A.</description>
      <pubDate>Mon, 26 Nov 2007 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe165.html</link>
    </item>
    <item>
      <title>Testers check out automotive LVDS parts</title>
      <description>Flexible modules can be used to test such functions as the LVDS connections between video sources and LCDs.</description>
      <pubDate>Mon, 26 Nov 2007 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe166.html</link>
    </item>
    <item>
      <title>Optical inspection uses intelligent detection</title>
      <description>The latest version of the successful OptiCon AdvancedLine inline AOI system features an increase in test speed by up to 30%.</description>
      <pubDate>Fri, 23 Nov 2007 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe162.html</link>
    </item>
    <item>
      <title>Boundary scan controllers have LXI interfaces</title>
      <description>Complementing existing SFX controllers for PCI, PCIe, PXI, PXIe, USB/LAN and FireWire, the new SFX/LXI1149-(x) controller series is the seventh family of Scanflex controllers.</description>
      <pubDate>Fri, 23 Nov 2007 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe163.html</link>
    </item>
    <item>
      <title>Software automates scanning</title>
      <description>System Cascon 4.4.1 contains new tools for test and in-system programming of Flash Eeprom devices, increasing the number of integrated tools to 36. </description>
      <pubDate>Wed, 31 Oct 2007 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe161.html</link>
    </item>
    <item>
      <title>Relay board enables numerous matrix configurations</title>
      <description>By changing bridges at the relays and selective switching of the relay interfaces with each other, the USB 31128 can be adapted to specific applications. </description>
      <pubDate>Mon, 15 Oct 2007 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe160.html</link>
    </item>
  </channel>
</rss>
