Product category:
Board-Level Instruments
News Release from: Goepel Electronic | Subject: SFX/PXI1149-(x)
Edited by the Electronicstalk Editorial
Team on 15 August 2005
Boundary scan controllers switch to PXI
Goepel Electronic has developed new PXI based boundary scan controllers for its Scanflex boundary scan hardware platform.
Goepel Electronic has developed new PXI based boundary scan controllers for its Scanflex boundary scan hardware platform Called SFX/PXI1149-(x), this new family of Scanflex boundary scan controllers (SFX controllers) consists of 3U PXI modules in three performance classes
This article was originally published on Electronicstalk on 26 Jul 2004 at 8.00am (UK)
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"Goepel Electronic was convinced of PXI's success as early as 7 years ago, when we introduced the worldwide first boundary scan controller for the PXI hardware platform".
"Today, PXI is one of the most important integration platforms for modular test and measurement instrumentation".
"With the new Scanflex controllers we open up this market segment for JTAG/boundary scan applications of an unprecedented quality", notes Heiko Ehrenberg, Manager of US operations for Goepel Electronics in Austin, Texas.
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"By combining extended structural tests, based on the scalable Scanflex system architecture, with functional tests utilising additional PXI instruments, one can achieve a vast improvement in both test coverage and quality of diagnostic output".
Just like the PCI and USB2.0/LAN based Scanflex controllers introduced earlier this year, the SFX/PXI1149-(x) controllers are available in three different performance classes.
The models differ in the upper clock-frequency limit (20, 50 or 80MHz) as well as the level of implementation of the enhanced Space II chipset for high performance scan operations.
In contrast to conventional solutions, the integrated Fastscale technology allows an upgrade of the controller's performance class "on the fly", without intricate mounting of additional hardware.
Furthermore, as standard features all Scanflex controllers include Adycs II to compensate for signal path delays, and Hyscan for dynamic splitting of serial TAP vectors and parallel I/O vectors.
In combination with the wide range of the other modular Scanflex components, such as Scanflex TAP transceiver (SFX Transceiver) and Scanflex I/O modules (SFX Modules), PXI based boundary scan systems with up to eight concurrent TAP and 31 additional Scanflex modules can be configured.
All TAP provide programmable input and output voltage, programmable input and output impedance, programmable TCK frequency, programmable delay compensation, read-back of the output signals and a relay controlled power signal.
Additionally, resources such as 32 dynamic I/O, two analogue I/O channels, three static I/O, and trigger lines are standard features.
All SFX controllers, SFX modules and SFX TAP transceivers can be combined with each other, with cable lengths of five meters and more.
This allows an optimal adaptation even to highly complex UUTs and nearly any integration environment.
The SFX/PXI1149-(x) controllers fully support all trigger features provided by the PXI specification.
In combination with other specifically for JTAG/boundary scan applications developed PXI modules by Goepel Electronic, such as digital and mixed-signal I/O modules, and power supply modules, extraordinary powerful test systems based on the IEEE1149.x standard family can be configured.
The new controller SFX/PXI1149-(x) is fully supported in the industry leading System Cascon boundary scan software from version 4.2.1 on.
Based on Cascon API functions (Cascon application programming interface), software plug-in modules are available for comfortable system integration using tools such as NI LabView, NI LabWindows and NI TestStand, among others. Request a free brochure from Goepel Electronic ...
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