Product category:
ATE Systems
News Release from: Goepel Electronic | Subject: Boundary scan option for Spea 3030
Edited by the Electronicstalk Editorial
Team on 21 September 2006
In-circuit tester adds boundary scan
option
Goepel Electronic and Spea have developed a next generation boundary scan option for the Spea 3030 in-circuit tester (ICT).
Goepel Electronic and Spea have developed a next generation boundary scan option for the Spea 3030 in-circuit tester (ICT) The solution is based on the complete integration of Goepel Electronic's recently introduced Scanflex hardware architecture, in combination with the Cascon Galaxy boundary scan system software, involving the analogue and digital pin electronics of the Spea 3030
This article was originally published on Electronicstalk on 26 Jul 2004 at 8.00am (UK)
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"After the successful implementation of our boundary scan tools on the Spea 4040 flying probe tester, we can now also offer the same level of sophistication for boundary scan tool integrations on the Spea 3030 in-circuit tester", says Bettina Richter, Manager of Marketing and International Sales at Goepel Electronic.
"This allows the customer to reuse JTAG/boundary scan test and in-system programming applications on all Spea board test platforms without any modifications".
"At the same time, the test coverage can be improved by using the ICT native analogue and digital pin electronic to complement the boundary scan resources on the unit under test".
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"The Spea 3030 is the latest development in the field of bed-of-nail based test equipment".
"Therefore, the integration of Goepel's innovative boundary scan solutions is a matter of course", declares Uwe Winkler, Sales Manager at Spea.
"With this integration, we can offer the professional solutions our customers expect".
"The Spea 3030 is a test system family that satisfies all test requirements, such as parametric analogue and digital in-circuit test, cluster and functional tests, the test of power electronics with respective tester modules, and complete boundary scan test and in-system programming applications with Goepel Electronic's Scanflex platform".
The hardware integrated into the Spea 3030 includes a Scanflex PCI controller with a clock frequency of up to 20MHz (SFX/PCI1149-A) or up to 50MHz (SFX/PCI1149-B).
The SFX-TAP4/FXT Scanflex transceiver is used for integration in in-circuit test equipment, featuring four parallel and independent test access ports (TAPs), together with type TIC02/SR TAP interface cards (TIC), which can be integrated into a bed-of-nail fixture.
This architecture can provide clock frequencies up to 50MHz to the unit under test without signal degradation.
At the same time, the TIC02/SR supports various signal families, including LVTTL, AUC, AUP, GTL, and others.
The unit under test is connected through the standard interface of the in-circuit tester.
In addition to the test bus signals, the SFX-TAP4/FXT provides 32 voltage programmable, dynamic I/O channels.
The integrated boundary scan development and execution software package Cascon Galaxy is integrated into the Spea 3030 Leonardo operating system through the powerful Cascon application programming interface.
The boundary scan software feature set can be customised via enable codes.
The boundary scan software communicates with the in-circuit tester's pin electronic through the Hyscan technology implemented in Cascon Galaxy.
Hyscan, based on a specialised emulation technique, manages the dynamic separation of serial TAP vectors and parallel I/O vectors.
The parallel vectors are linked to the physical I/O interface only at run-time and are therefore tester hardware independent.
For the test development, online debugging, as well as pin and net level fault diagnostics using Cascon Galaxy's boundary scan tools, the in-circuit tester channels connected to the unit under test are presented to the user as bidirectional tester channels which can be used just like any other boundary scan pins; detailed knowledge of the process is not required, the software integration handles the test vector mapping automatically.
In addition to digital I/O pin cards, the integration also supports analogue I/O pin cards.
Delivery of Scanflex integration packages for the Spea 3030 starts in the third quarter of 2006. Request a free brochure from Goepel Electronic ...
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