Product category:
Embedded Software and Operating Systems
News Release from: Green Hills Software | Subject: Probe for Manufacturing
Edited by the Electronicstalk Editorial
Team on 09 May 2007
Debug probe optimises software during
manufacture
Debug probe comes with Python-based automation, a fully scriptable Web 2.0 user interface, and support for virtually every NOR flash part in existence.
Green Hills Software's Probe for Manufacturing is a debug probe with Python-based automation, a fully scriptable Web 2.0 user interface, and support for virtually every NOR flash part in existence It brings device software optimisation to the manufacturing and production phases of the product cycle
This article was originally published on Electronicstalk on 21 Mar 2001 at 8.00am (UK)
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"The production and manufacturing phases of a product are often just as important as a product's design and implementation phases", notes David Kleidermacher, Chief Technology Officer, Green Hills Software.
"There is no return on the millions of dollars invested in a product's development until that product successfully reaches volume production".
"Based on our own experience in manufacturing three generations of debug probes, we've designed Probe for Manufacturing to help reduce time-to-volume production by optimising the testing and configuration of devices as they come off the assembly line".
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Based on Green Hills' Probe V3 platform, Probe for Manufacturing uses an onboard Python interpreter with full access to all traditional debug probe run-control functions to enable production engineers to devise any conceivable test for their manufacturing line.
A Web 2.0 user interface lends a friendly face to all of this power.
As every Probe for Manufacturing component is written in Python, the user interface can be customised to any requirement, and can be run on Probe for Manufacturing or a desktop PC.
Scripting and Web files are all stored on a reliable Flash file system residing on Probe for Manufacturing.
The probe comes with the Green Hills Debug Client, a library that enables production test system designers to integrate existing PC-based test interfaces with the Probe for Manufacturing.
With the Green Hills Debug Client, test infrastructure designers can take advantage of the speed, connectivity, and debugging features of Probe for Manufacturing without creating new or modifying existing human-machine interfaces.
"Combining novel features like Web 2.0 with deep and broad support for traditional manufacturing validation requirements, such as device troubleshooting, memory testing, and efficient flash programming, Probe for Manufacturing is a refreshingly creative solution to production and manufacturing needs", says Jerry Krasner, PhD, Chief Analyst at Embedded Market Forecasters.
"By bringing the interactive features of the latest Web technologies to manufacturing, Green Hills Software's Probe for Manufacturing will make production testing systems easier than ever to design and deploy".
Probe for Manufacturing provides built-in support for programming virtually every NOR flash part in existence, with fine-grained scalability of total memory usage from zero byte for the smallest systems to hundreds of kilobyte for ultrafast programming of larger systems.
Probe for Manufacturing supports a broad set of CPU debug ports, including IEEE 1149.1 JTAG, at the highest speeds.
Production testing can be sped up with download rates in excess of 10Mbit/s and sustained JTAG TCK rates over 100MHz.
Probe for Manufacturing is powered by Green Hills Software's Integrity real-time operating system.
Integrity's support of industry standards like POSIX enabled the creation of a probe that melds the latest Web and desktop technologies with the high level of robustness required for high-volume manufacturing test systems.
Probe for Manufacturing is available now for devices based on ARM, MIPS, and PowerPC processors.
Additional device support will be available in Q2 and Q3 2007.
It is compliant with RoHS, PSE, and CEC standards. Request a free brochure from Green Hills Software ...
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