Upgrade for embedded software testing

Tool for automating module/unit testing of embedded software expands to cover safety-critical applications.

Hitex has released a new version of Tessy, the tool for automating module/unit testing of embedded software.

The most significant enhancements in Tessy V2.5 include expanded test coverage as required especially for safety-critical applications according to SIL3.

The coverage measurement now supports modified-condition/decision-coverage (MC/DC) and multiple condition coverage (MCC).

Both measurements may be combined with the existing C1 (branch/decision) coverage measurement.

In this way Tessy even meets high critical test requirements as defined by international standards such as DO-178B level A for avionics software.

Tessy V2.5 also provides a novel feature related to stub functions, allowing the user to specify advanced stubs for local functions within the source file of the test object.

This provides more flexibility when testing complex test objects which call many local functions.

Up to now, only normal stub functions could be used.

Furthermore, it may now be specified individually for each test object, whether normal stubs or advanced stubs shall be used for different test objects, which call the same stub function.

In addition, the new version adds support for several new microcontrollers, including the DSP568E and PPC5xxx from Freescale and CCR32, NC30 and SH from Renesas.

A free evaluation version of Tessy is available for download from the Hitex website.

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