RSS News Feed for Hitachi High-Technologies (Electron Microscopy) - from Electronicstalk http://www.electronicstalk.com/news/hic/hic000.html Hitachi High-Technologies (Electron Microscopy) news releases on Electronicstalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Fri, 05 Dec 2008 08:00:00 UT Fri, 05 Dec 2008 08:00:00 UT Pro-Talk Ltd http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 Electron microscope has resolution for research Ultra-high-resolution scanning transmission electron microscope is characterised by new electron optics which now include a spherical aberration correction system. Wed, 10 Jan 2007 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic127.html TM-1000 on show at Buckingham Palace Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006. Mon, 04 Dec 2006 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic126.html Electron optics experts head for Japan Representatives from the Hitachi organisation throughout the world will be making a significant contribution to the 16th International Microscopy Congress in Japan next month. Thu, 17 Aug 2006 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic125.html Large chamber analytical VPSEM launched Hitachi High-Technologies has announced the launch of the S-3700N variable pressure scanning electron microscope (VPSEM). Fri, 14 Jul 2006 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic124.html Tabletop microscope takes a different view A new tabletop microscope has the potential to transform the field of basic microscopy. Mon, 10 Apr 2006 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic123.html Allen expands scope network Hitachi High-Technologies has announced a major expansion in sales territories for its electron microscopes. Mon, 20 Mar 2006 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic122.html Detector provides a powerful alternative Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope. Tue, 15 Nov 2005 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic121.html Heated holder aids nanoscale research Hitachi High-Technologies has introduced a directly heated specimen holder for use with the high resolution HD-2300 scanning transmission electron microscope (STEM). Mon, 08 Aug 2005 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic120.html Microscope gains an extra dimension A new, five-segment semiconductor backscattered electron detector with high sensitivity and fast response rates has been introduced for the S-3400N variable pressure SEM. Mon, 23 May 2005 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic119.html SEM boasts subnanometre resolution The latest addition to the range of scanning electron microscopes from Hitachi High-Technologies claims the world's highest resolution for an SEM. Thu, 10 Mar 2005 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic118.html SEM improves display and signal mixing The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation. Mon, 07 Feb 2005 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic117.html VPSEM boasts outstanding performance The S-3400N is a new variable pressure scanning electron microscope. Mon, 11 Oct 2004 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic116.html SEM boasts outstanding anaysis capabilities The S-4300SE/N from Hitachi High-Technologies provides a unique combination of a field emission source and variable pressure in a truly analytical instrument. Thu, 12 Aug 2004 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic115.html TEM promises nanometre-level resolution Outstanding spatial resolution at the nanometre level can be achieved on chemical element mapping in the HD-2300 scanning transmission electron microscope from Hitachi High-Technologies. Fri, 30 Jul 2004 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic114.html Microscope resolves to handle 8in wafers The S-4800 FESEM from Hitachi High-Technologies represents a breakthrough in FESEM technology, offering resolution figures of 1.0nm at 15kV yet capable of handling specimens up to 8in diameter. Mon, 28 Jun 2004 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic113.html Beam deceleration boosts resolution Beam deceleration technology is now an option for the S-4800 field emission scanning electron microscope (FESEM) from Hitachi High-Technologies. Wed, 19 May 2004 08:00:00 UT Hitachi High-Technologies (Electron Microscopy) http://www.electronicstalk.com/news/hic/hic112.html