Electron microscope has resolution for research

Ultra-high-resolution scanning transmission electron microscope is characterised by new electron optics which now include a spherical aberration correction system.

News from Electronicstalk, 10 January 2007

Electron optics experts head for Japan

Representatives from the Hitachi organisation throughout the world will be making a significant contribution to the 16th International Microscopy Congress in Japan next month.

News from Electronicstalk, 17 August 2006

Tabletop microscope takes a different view

A new tabletop microscope has the potential to transform the field of basic microscopy.

News from Electronicstalk, 10 April 2006

Detector provides a powerful alternative

Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope.

News from Electronicstalk, 15 November 2005

Microscope gains an extra dimension

A new, five-segment semiconductor backscattered electron detector with high sensitivity and fast response rates has been introduced for the S-3400N variable pressure SEM.

News from Electronicstalk, 23 May 2005

SEM improves display and signal mixing

The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation.

News from Electronicstalk, 7 February 2005

SEM boasts outstanding anaysis capabilities

The S-4300SE/N from Hitachi High-Technologies provides a unique combination of a field emission source and variable pressure in a truly analytical instrument.

News from Electronicstalk, 12 August 2004

Microscope resolves to handle 8in wafers

The S-4800 FESEM from Hitachi High-Technologies represents a breakthrough in FESEM technology, offering resolution figures of 1.0nm at 15kV yet capable of handling specimens up to 8in diameter.

News from Electronicstalk, 28 June 2004

Jones demonstrates benefits of electron microscopy

Hitachi High-Technologies has appointed Chris Jones as Applications Specialist and Demonstrator for its Electron Microscopy Division in the UK.

News from Electronicstalk, 19 March 2004

TEM warms quickly to its task

The new PC-controlled H-9500 TEM from Hitachi High-Technologies is designed for rapid operation.

News from Electronicstalk, 4 November 2003

• Scope for ultra-high resolution

• Ion beam system samples semiconductors

• High-resolution FESEM for large samples

• SEM gets a better image