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News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: TDS 92
Edited by the Electronicstalk Editorial
Team on 05 March 2003
Detector boosts microscope applications
A new technical datasheet details the use of the ESED environmental secondary electron detector in variable pressure scanning electron microscopes.
The ESED environmental secondary electron detector from Hitachi High-Technologies has significantly expanded the range of applications for the company's variable pressure scanning electron microscopes (VPSEMs) Use of the detector for the microscopy of electronic materials and devices and in materials science and life science is highlighted in a new technical datasheet from Hitachi, TDS 92
This article was originally published on Electronicstalk on 28 Jan 2002 at 8.00am (UK)
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SEM gets a better image
Hitachi High-Technologies has made a number of improvements to its S-4700 field emission SEM, which give significantly better image quality, particularly at low accelerating voltages.
ESED allows imaging to take place as a result of a process involving the secondary electrons generated in the VPSEM, which are impossible to collect under normal VPSEM operating conditions.
Images produced by ESED show surface detail and virtually eliminate the effects of specimen charging.
This offers a powerful alternative to the traditionally used backscattered electron detector.
Applications covered in TDS 92 include surface investigations of the pole plate of an electrolytic capacitor, wire-bonding joints of LSI devices, through holes in PCBs and cross-sectional structures of ball grid array solder joints.
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