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Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-4300SE/N
Edited by the Electronicstalk Editorial
Team on 11 July 2003
Scope for ultra-high resolution
The S-4300SE/N field emission variable pressure scanning electron microscope combines the high resolution and image quality of a field emission source with variable pressure operation.
The S-4300SE/N field emission variable pressure scanning electron microscope (FEVPSEM) combines the high resolution and image quality of a field emission source with the versatility of variable pressure operation to handle difficult samples The new microscope has a pressure operating range of 10-1000Pa, which means that it can be used to examine an even wider range of wet, oily or non-conducting samples than many VPSEMs
This article was originally published on Electronicstalk on 12 Aug 2004 at 8.00am (UK)
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SEM boasts outstanding anaysis capabilities
The S-4300SE/N from Hitachi High-Technologies provides a unique combination of a field emission source and variable pressure in a truly analytical instrument.
SEM gets a better image
Hitachi High-Technologies has made a number of improvements to its S-4700 field emission SEM, which give significantly better image quality, particularly at low accelerating voltages.
Additional detector brings enhanced imaging
The ultra-high-resolution in-lens S-5200 FESEM from Hitachi High-Technologies has been enhanced with an optional electron detector for imaging backscattered electrons at low accelerating voltages.
These types of samples cannot be easily imaged at all in conventional SEMs without using specialised sample preparation techniques.
The thermal Schottky emission electron source offers high brightness and excellent resolution over a wide range of accelerating voltages.
High resolution can be achieved in both high pressure and high vacuum modes, using a variety of detectors such as secondary electron, backscattered electron and Hitachi's optional environmental secondary electron detector (ESED).
The exceptional long-term beam stability of the S-4300SE/N makes it ideally suited to elemental analysis.
The microscope is fully compatible with energy dispersive X-ray (EDX) spectrometers and the latest parallel beam spectrometers (PBS) which give increased elemental sensitivity, especially for light elements.
Samples up to 160mm diameter can be accommodated in the large specimen chamber and there is a choice of two five-axis stages with eucentric tilt.
The larger stage has 100mm x movement and 50mm y movement and 360-degree rotation, together with comprehensive z and tilt capabilities.
The S-4300SE/N has extensive automated features, including autofocus, autostigmator, autobrightness and autocontrast.
Images are acquired digitally and image processing and image management systems are incorporated in the instrument.
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