Product category:
Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-3400N
Edited by the Electronicstalk Editorial
Team on 07 February 2005
SEM improves display and signal mixing
The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation.
The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation In addition to its sophisticated array of automated facilities, the S-3400N features the highly popular GUI first introduced on the S-4800 FESEM
This article was originally published on Electronicstalk on 11 Oct 2004 at 8.00am (UK)
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VPSEM boasts outstanding performance
The S-3400N is a new variable pressure scanning electron microscope.
Facilities include a full screen mode which makes almost the entire screen available for image observation to enable rapid location of features of interest.
A movable small screen display is also provided for image optimisation or local area X-ray scanning.
There is also a new, real-time dual image display to allow images from two different detectors to be displayed simultaneously.
Each image may be adjusted independently and the signals can also be mixed together.
This would allow a combined image to be produced from, for example, secondary electron and backscattered electron detector.
The GUI display is fully configurable for the user to allow display of the essential control functions and also features an animation which shows users how to carry out routine maintenance such as changing a filament.
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