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Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-5500
Edited by the Electronicstalk Editorial
Team on 10 March 2005
SEM boasts subnanometre resolution
The latest addition to the range of scanning electron microscopes from Hitachi High-Technologies claims the world's highest resolution for an SEM.
Hitachi High-Technologies has launched the S-5500, a new addition to its range of FESEMs which brings the world's highest resolution for an SEM This in-lens scanning electron microscope offers previously unobtainable resolutions of 0.4nm at 30kV and 1.6nm at 1kV
This article was originally published on Electronicstalk on 28 Jan 2002 at 8.00am (UK)
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SEM gets a better image
Hitachi High-Technologies has made a number of improvements to its S-4700 field emission SEM, which give significantly better image quality, particularly at low accelerating voltages.
The in-lens configuration not only provides unparalleled resolution but is also fully compatible with EDX detectors, and offers high EDX sensitivity.
EDX analysis and imaging can be carried out without changing specimen position.
Hitachi's patented Super ExB energy filter enhances signal collection efficiency and allows the secondary and backscattered electron contributions to the image to be optimised.
A brand new intelligent graphical user interface has been combined with a large LCD monitor to enables crisp, high quality images to be produced quickly and easily.
A simple mode selection makes it easy to switch between high resolution imaging and EDX analysis operating conditions.
The S-5500 can be linked to the PCI database for web-enabled microscopy.
The microscope's side-entry specimen stage has excellent stability and provides smooth motion at even the highest magnifications.
A wide variety of specimen holders are available for a host of different sample types and applications.
These include cross-sections, transmission specimens, rotating samples and cryo-specimens.
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