Product category:
Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-3400N
Edited by the Electronicstalk Editorial
Team on 15 November 2005
Detector provides a powerful alternative
Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope.
Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope The new detector provides a powerful alternative to traditional backscattered imaging used in the VPSEM and closely mimics a conventional secondary electron detector to give good surface information
This article was originally published on Electronicstalk on 11 Oct 2004 at 8.00am (UK)
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VPSEM boasts outstanding performance
The S-3400N is a new variable pressure scanning electron microscope.
The new ESED uses the fact that secondary electrons produced from the sample surface by the primary beam can ionise gas molecules that are present in the chamber when operating in "high pressure" mode.
This results in the presence of positive and negative ions as well as electrons in the chamber.
The detector features an electrode which creates an avalanche effect from the ionisation process.
In a new, patented configuration, the ion current produced is collected with significantly improved signal/noise ratio, producing images of outstanding quality.
The new detector has a rapid response and works well both at long and short working distance and low and high accelerating voltages.
Addition of the ESED allows simultaneous ESE and BSE imaging and EDX analysis.
Signal mixing allows surface detail from ESED to be combined with atomic number contrast from the BSD.
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