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    <pubDate>Thu, 24 Apr 2008 08:00:00 UT</pubDate>
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      <title>Standards working group calls for feedback</title>
      <description>The IEEE P1581 has set up its working group to define a low-overhead design-for-test methodology to be implemented in memory devices.</description>
      <pubDate>Thu, 19 Apr 2007 08:00:00 UT</pubDate>
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