Product category:
Recruitment, Reports and Resources
News Release from: IEEE P1581 Working Group
Edited by the Electronicstalk Editorial
Team on 19 April 2007
Standards working group calls for
feedback
The IEEE P1581 has set up its working group to define a low-overhead design-for-test methodology to be implemented in memory devices.
The IEEE P1581 working group is defining a low overhead design-for-test (DFT) methodology to be implemented in memory devices for the support of board- and system-level connectivity test Additionally, P1581 proposes standard means of access to other (optional) on-chip resources, such as device identification, built-in self test (BIST) and/or built-in self repair (BISR) circuitry
This article was originally published on Electronicstalk on 8 Nov 2004 at 8.00am (UK)
Related stories
Engineers and technicians must be trained
Leading UK engineering and technology firms, with a combined multi-million pound spend on training and development, will assemble at the IEE 'Investing in Technical Teams' forum on 4 November 2004.
Workshop gives complete picture on CE.NET 5.0
A UK-based workshop will give embedded software development engineers hands-on experience in running the new 5.0 release of Windows CE.NET on next generation processors.
As a slave to any external test resource (eg in-circuit tester (ICT), onboard IEEE1149.1 (JTAG) boundary-scan ICs, board-level BIST circuitry etc), P1581 is an alternative for memory devices that might not otherwise implement another formalised DFT infrastructure.
Further, a given external master need not be a "test" resource and the P1581-accessible circuitry need not be provisioned solely for "test" purpose.
The P1581 test logic is quite simple and provides for very fast test execution with robust diagnostics.
Perhaps more importantly, a P1581 implementation can be achieved without extra (non-mission-mode) device pins.
A white paper titled "An economical alternative to boundary scan in memory devices" can be downloaded from the working group website.
This white paper provides an overview of various technical details of the proposed standard.
The working group would like to solicit comments and opinion of the proposal, aiming to get as much feedback - positive or negative - as possible from the electronics industry, in particular both vendors and users of memory devices.
The working group would be glad to have interested parties sit in on a (teleconference) meeting or become a participating member.
Please contact the working group chair to receive a notice of the next meeting and telephone access information.
• IEEE P1581 Working Group: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page
Search the Pro-Talk network of sites
