Introductory guide explains boundary scan

A new booklet aims to "demystify" test procedures in general and illustrates the benefits of adopting boundary-scan test and in-system programming as an integral part of a product's development.

Throughout the electronics industry, manufacturers are turning to the latest device technologies, such as BGAs (ball-grid arrays), chip-scale packages, and other small outlines, to provide the functionality and miniaturisation they need.

However, the new packaging increases the difficulty of accessing printed circuit boards (PCBs) for testing and onboard device programming.

Industry has addressed these difficult access problems through adoption of the IEEE1149.1 boundary-scan/JTAG standard as the test and in-system programming solution for today's problems.

Although some test engineers may already be familiar with the technology, many others will be looking at its possibilities for the first time.

Equally, designers working with test engineers at the DFT (design-for-test) phase of product development need to be aware of the overwhelming benefits of the boundary-scan technology for testing their products.

With both these issues in mind JTAG Technologies has compiled a new 30 page introductory guide for beginners.

The booklet aims to "demystify" test procedures in general and, more specifically, illustrates the benefits of adopting boundary-scan test and in-system programming as an integral part of a product's development.

The booklet (English language) is available now and can be ordered free of charge via the company's website.

It covers amongt others the following topics, discussing the latest trends/techniques in boundary scan: the recent history of electronic test; alternative methods for limited test access; requirements for a boundary-scan design implementation; what can be accomplished with boundary-scan; embedded testing; boundary-scan testing integrated with ICT; and example of a boundary-scan test sequence.

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