Product category:
ATE Systems
News Release from: JTAG Technologies | Subject: PCI I/O access modules
Edited by the Electronicstalk Editorial
Team on 07 January 2003
Test interfaces access PCI cards and
slots
JTAG Technologies announces the availability of new I/O products to significantly increase the test access of boundary-scan designs, especially those with PCI interfaces.
JTAG Technologies announces the availability of new I/O products to significantly increase the test access of boundary-scan designs, especially those with PCI interfaces Two of the new products are especially designed for testing PCI slots on motherboards and backplanes, and for testing PCI card interfaces
This article was originally published on Electronicstalk on 25 Jul 2005 at 8.00am (UK)
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Boundary scan modules access complex boards
JTAG Technologies has a new family of digital I/O scan modules for enhanced testing of complex printed circuit boards.
These PCI I/O access modules are plug-in cards, compatible with standard 32 and 64bit PCI slots and supporting 3.3 and 5V PCI buses.
The third new I/O access module, for general use, is a DIMM carrier that provides boundary-scan access to up to 256 customer-configurable test points designed for convenient mounting when no test fixture is available.
This carrier can contain one or two DIMM DIOS modules, which is an already existing JTAG Technologies product.
All mentioned I/O products can be used in combination with JTAG Technologies high performance boundary-scan controllers.
Engineers will benefit with greater design flexibility and a highly effective means of reaching their DFT goals by gaining boundary-scan access to points that would otherwise be unavailable for testing.
The I/O products can be configured in separate boundary-scan chains or can be incorporated in any other chain already available in the design.
JTAG Technologies' test development packages support automatic generation of the test vectors for this application. Request a free brochure from JTAG Technologies ...
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