Product category:
ATE Systems
News Release from: JTAG Technologies | Subject: DataBlaster JT 37X7 series
Edited by the Electronicstalk Editorial
Team on 16 May 2003
Boundary scan controllers boost
performance
High-performance boundary-scan IEEE1149.1 controllers satisfy increasing requirements for faster and deeper in-system programming of Flash and CPLDs as well as complex digital PCB testing.
JTAG Technologies announces a further ground-breaking extension of its line of high-performance boundary-scan IEEE1149.1 controllers with the introduction of three new members of the DataBlaster family, also known as the JT 37X7 series JTAG Technologies has developed its scalable architecture of boundary-scan controllers to satisfy increasing requirements for faster and deeper in-system programming of Flash and CPLDs as well as complex digital PCB testing
This article was originally published on Electronicstalk on 25 Jul 2005 at 8.00am (UK)
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The new controllers, available initially in PCI and CompactPCI (3 and 6U) forms, support unlimited target memory width (from 1bit to more than 64Kbit) for Flash programming and offer the user unsurpassed sustained test clock speeds of guaranteed 40MHz for reliable operation at the highest throughput.
Users can grow in sync with their needs from the basic model to higher performance models by adding the optional Enhanced Throughput Technology (ETT) module and/or the Flash Image module supporting onboard image memory sises up to 128Mbit.
Supplied with the recently announced Quad POD, also from JTAG Technologies, the JT 37x7 DataBlaster is fully compatible with the new low-voltage technologies.
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A breakthrough product enables engineers to prepare PCB testing and in-system programming applications based on the IEEE1149.x boundary-scan standards, rapidly and easily.
It drives four synchronised TAPs (test access ports), supporting multi-TAP test targets (UUTs) or gang programming of four single TAP targets.
QuadPOD technology also allows maximum test speeds by incorporating high-speed signal conditioning, logic threshold adjustments and cable delay compensations into a compact, remote extension module.
The new DataBlaster range starts with the low-cost entry model JT 3707 priced at around $3250.
This unit offers high-speed 40MHz test capability and can be easily upgraded to the JT 3717 and JT 3727 with the ETT and/or the Flash Image modules for Flash ISP.
These modules can either be added later or the user can opt to purchase a JT 3717 or JT 3727 with the modules fitted as standard and 64 and 128Mbit of Flash capacity, respectively.
The ETT and Flash image modules offer new flexibility to program memories with variable data-bus widths.
Serial PROMs using I2C and/or SPI bus are now more easily accommodated.
The new JT 37x7 DataBlaster controllers are fully compatible with existing JTAG Technologies test and ISP applications, allowing easy upgrades.
Compliant programs include JTAG Technologies Test Developer, Flash Developer, PLD Developer and Production Stand-Alone software systems.
Support is also provided to execute tests under National Instruments' TestStand, LabView and LabWindows/CVI.
Furthermore, the JT 37x7 DataBlasters are compatible with the original DataBlaster pod system (PF 2137 series) at up to 30MHz test clock frequency. Request a free brochure from JTAG Technologies ...
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