Platform aids multivendor test system integration

As a member of the PXI Systems Alliance, JTAG Technologies supports the PXI platform for meeting a wide range of manufacturing test needs.

As a member of the PXI Systems Alliance, JTAG Technologies supports the PXI platform for meeting a wide range of manufacturing test needs.

Through hardware and software interoperability, PXI modularity allows easy integration of multivendor test systems as well as flexibility across other platforms.

Boundary-scan plays a key role in the integrated test system, delivering highly effective structural testing and in-system programming, for even the most crowded and complex printed circuit boards.

Many boundary-scan implementations involve a stand-alone PC-based test station, prior to and separate from the functional test step.

However, electronics manufacturers are increasingly turning to an integrated approach, installing the JTAG Technologies' PXI-based boundary-scan controller within the functional test system.

Boundary-scan test vectors are driven to the target, and results are collected via the JTAG Technologies high-speed controller and front-end QuadPOD.

The controller can drive four independent scan chains, and multiple controllers can be used to provide very high test and in-system programming throughput.

The QuadPOD provides signal integrity, extended range, and voltage level matching at high test clock rates, up to 40MHz sustained scan rate.

The test sequence, managed by an executive such as National Instruments' TestStand, performs the scripted set of structural and functional tests, typically followed by the Flash and PLD programming operations.

Faults at any step would usually stop the sequence with results and diagnostics reported back to the operator.

This combination of structural and functional is so effective because the two test methods are highly complimentary, verifying the target's performance against different objectives, with little overlap, delivering high coverage for the expected fault spectrum, all in one test station.

The solution offers excellent economics in terms of low capital investment, ease of use, and minimal recurring expenses, most notably a near-complete avoidance of expensive fixturing.

The PXI bus structure is a key contributor in delivering this power so cost-effectively.

Because the integrated system is compact, it can fit into a distributed test plan, rather than forcing the user into centrally positioning one expensive in-circuit tester.

Product flow is streamlined by means of fewer test and programming stations.

Simplification of test fixtures, or outright elimination of fixtures, is a big benefit, both in terms of sheer cost as well as being able to easily support high-mix production lines with identical test set-ups.

Back to top