Product category:
ATE Systems
News Release from: JTAG Technologies
Edited by the Electronicstalk Editorial
Team on 02 February 2005
Seica systems integrate boundary scan
JTAG Technologies has integrated its test methods within the Seica Pilot and Pilot LX flying-probe in-circuit test systems.
JTAG Technologies has integrated its test methods within the Seica Pilot and Pilot LX flying-probe in-circuit test systems As a result, electronics designers and manufacturers will benefit from even greater testability and programmability of complex boards, all within a single process step
This article was originally published on Electronicstalk on 25 Jul 2005 at 8.00am (UK)
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Seica's flying probe systems are already among the most successful and advanced fixtureless test systems on the market with comprehensive shorts/opens, analogue, power-up, vectorless, and AOI testing.
The integrated boundary-scan capabilities will now further enhance their high-precision digital testing capabilities.
Test development and deployment times are minimised, test coverage is maximised, and fixturing is negligible, even for complex digital PCBs where physical access to electrical nodes is limited.
The JTAG Technologies tools also provide high throughput in-system programming, via boundary-scan of onboard Flash memories and PLDs.
David Sigillo, General Manager of Seica, says: "Our customers have asked us to integrate boundary-scan into our products".
"In order to meet this request for high-performance digital testing, we are very pleased to combine with JTAG Technologies in offering an integrated solution".
"Customers will gain greater test coverage while maintaining fixtureless test access".
Pilot and Pilot LX systems equipped with JTAG boundary-scan capabilities are available immediately via Seica's distribution channels, with pricing for the boundary-scan option ranging from about US $11,000 to $19,000. Request free introductory details about products from JTAG Technologies ...
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