Product category:
Stand-Alone Instruments
News Release from: Keithley Instruments | Subject: Model 4200-SCS
Edited by the Electronicstalk Editorial
Team on 31 October 2001
Capacitance characterisation added to
chip tester
Keithley Instruments has developed capacitance characterisation software for its Model 4200-SCS semiconductor characterisation system.
Keithley Instruments has developed capacitance characterisation software for its Model 4200-SCS semiconductor characterisation system The new capacitance characterisation capabilities allow users to conduct simultaneous high frequency (HF) and quasistatic (QS) C-V measurements on wafer devices with a single voltage sweep, using Keithley's Model 82 simultaneous C-V instrumentation
This article was originally published on Electronicstalk on 2 Apr 2007 at 8.00am (UK)
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Upgrade for semiconductor characterisation
KTE Interactive V6.1 is an updated version of the powerful measurement software for the Model 4200-SCS semiconductor characterisation system.
This technique, which is unique to Keithley, improves C-V measurement accuracy by reducing the voltage stress on the devices under test and eliminating the need for the use of theoretical curves and doping profile assumptions.
Simultaneous C-V requires only half the sweep time of sequential HF/QS measurements, so it also increases test productivity.
The new characterisation capabilities and the Model 4200-SCS support Keithley Model 590 and Model 595 C-V meters, as well as meters from other manufacturers.
Further reading
Characterisation system gains pulse capabilities
Keithley Instruments now offers pulse generation and measurement in its Model 4200-SCS semiconductor characterisation system.
Characterisation package goes further
New from Keithley Instruments is the Model 4200-SCS semiconductor characterisation system with its integral Keithley Test Environment-Interactive (KTEI) v5.0 software.
Characterisation links with modelling
A new software driver allows users to combine the Keithley Model 4200-SCS semiconductor characterisation system with Agilent Technologies' IC-CAP device modelling software environment.
The Model 4200-SCS has the added advantage of being the only parameter analyser available that also provides built-in prober control.
When combined with the features of the Model 4200-SCS, the new simultaneous C-V measurement capabilities offer device designers and process engineers many more tools than any other semiconductor characterisation package available.
The new characterisation capabilities are provided as a collection of instrument drivers and test libraries that extend the Keithley Test Environment (KTE) interactive test tools included with the Model 4200-SCS.
The Model 4200-SCS's familiar Microsoft Windows interface and the new add-on capabilities make it easy to perform simultaneous C-V measurements and extract critical device parameters without programming.
The new software interfaces with the Keithley Configuration Utility (KCON) included in Version 4.2 of KTE Interactive.
KCON and the new instrument drivers minimize hardware and software integration problems by providing an easy way to configure external C-V instruments, such as Keithley's Model 590 (HF) C-V analyser and Model 595 (QS) C-V meter.
After the user configures the GPIB addresses for the external C-V instruments, the test libraries supplied are ready to run on the Model 4200-SCS.
The software leads the user step-by-step through the process of generating new test configurations for simultaneous C-V measurements, such as C-V against VGS, non-equilibrium current Q/t against VGS, and the many others contained in the test libraries.
Next, with a click of the mouse, the system runs the entire user-defined test sequence automatically.
The Model 4200-SCS's built-in data reduction routines make it easy to display, graph, and analyse measurement data.
Data can be tabulated automatically using the system's spreadsheet functions, while plotting tools simplify displaying device parameters graphically.
Furthermore, powerful analysis tools allow displaying and analysing curves interactively using multiple windows.
Data can be saved in either ASCII or binary format.
It's easy to cut and paste data from the Model 4200-SCS into the user's favourite Windows-based software for customised analysis.
Keithley's simultaneous C-V instrument drivers and test libraries will be available with KTE Interactive v4.2 Service Pack 1, planned for release in September.
The software is free for registered users of the Model 4200-SCS with KTE Interactive v4.2. Request a free brochure from Keithley Instruments ...
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