Characterisation links with modelling
A new software driver allows users to combine the Keithley Model 4200-SCS semiconductor characterisation system with Agilent Technologies' IC-CAP device modelling software environment.
Keithley Instruments has a software driver that allows users to control its Model 4200-SCS semiconductor characterisation system while operating within the popular Agilent Technologies' IC-CAP device modelling software environment.
Now, semiconductor labs can take advantage of the ease-of-use, high speed, and subfemtoamp resolution of the 4200-SCS, while serving the differing needs of users who perform device modelling studies versus device characterisation.
The Model 4200-SCS offers the most advanced test capabilities available in a fully integrated characterisation system, including a complete, embedded PC with Windows NT operating system, mass storage, and a browser-style project navigator for test organisation and control.
The driver supports comprehensive functional control of up to eight SMUs, preamps, ground unit, and all instrument ranges and resolutions.
Remote, low-noise preamplifiers extend measurement resolution to 0.1fA.
The driver also provides for fine adjustment of delay factor, filter factor, and integration time in addition to simple short, medium, and long settings.
IC-CAP is a modelling and analysis package developed and supported by Agilent Technologies, and used to automate measurements, simulate device performance, extract data, and optimise model parameters.
Its statistical analysis capabilities can be used to create and maintain accurate model libraries for a wide range of semiconductor device types, including MOS, BJT, MESFET/HEMFET, thin-film devices, and many others.
IC-CAP runs on a Unix workstation under the Sun Solaris, or HPUX, operating system.
The Keithley IC-CAP instrument driver for the Model 4200-SCS has been verified with IC-CAP version 5.3 and IC-CAP 2001.
Driver source code is available to allow users to integrate its functionality into their own applications.
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